FILTER PRODUCTS

to
to
to
to
to
to
Beam Profiling And Beam Imaging For X-Ray 1-200 Nm
Star Tech Instruments
The goal of visualizing and measuring beams in the X-ray has taken on new importance. Star Tech Instruments has developed new systems to analyze these beams for Power/ Energy, Uniformity, High resolution Beam Profile and Image analysis. Model µBIP10x is a vacuum compatible (1x10-10 Torr) Beam profiler and Beam Imaging system designed ...
  • Sensor Type: Other
  • Measurable Sources: CW
  • Wavelength Range: 1 - 200 nm
  • # Pixels (Width): -- 
  • # Pixels (Height): -- 
  • ...
Data Sheet
Focus Monitor FM100
Metrolux GmbH
Thanks to its versatility the FM100 is already in use for regular quality control of the laser beam in the display and semiconductor industries as well as in the processing of materials in the automotive industry. In addition to the integrated high power attenuator the FM100 has two filter slots for flexible attenuation of laser ...
  • Sensor Type: CCD
  • Measurable Sources: Pulsed
  • Wavelength Range: 248 - 1100 nm
  • # Pixels (Width): 1388 
  • # Pixels (Height): 1036 
  • ...
Data Sheet
Laser Propagation Monitor LPM200
Metrolux GmbH
The exact characterization and specification of laser beam sources is crucial to provide and maintain a high product quality in the laser production. Systems integrators can choose the beam sources to use and integrate according to the parameters defined in the international standard. Metrolux Measurement systems are designed for a ...
  • Sensor Type: CCD
  • Measurable Sources: Pulsed
  • Wavelength Range: 340 - 1100 nm
  • # Pixels (Width): 1388 
  • # Pixels (Height): 1036 
  • ...
Data Sheet
Beam Monitor BM8304
Metrolux GmbH
Low S/N ratios and a high sensor response linearity are prime attributes of the sensor employed in this Metrolux beam profiler. The Software provides the functions required for the international standards EN-ISO 11145, 11146, 11670 and 13694 that cover aspects of laser light characterization. The beam profiler camera BPC8304 uses a ...
  • Sensor Type: CCD
  • Measurable Sources: Pulsed
  • Wavelength Range: 340 - 1100 nm
  • # Pixels (Width): -- 
  • # Pixels (Height): -- 
  • ...
Data Sheet
XRV-2000 Falcon Camera Phantom
Logos Systems
The XRV-2000 Falcon Beam Profiler combines high-energy radiation detection with precision two dimensional metrology to form a completely electronic alternative to film-based measurements. The XRV-2000 Falcon measures the XY location and profile of radiation beams with unmatched speed and accuracy. Single beams and proton energy layer ...
  • Sensor Type: CCD
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 0.01 - 10 nm
  • # Pixels (Width): 1280 
  • # Pixels (Height): 960 
  • ...
Data Sheet
XRV-100 Digital Camera Phantom
Logos Systems
The XRV family of X-ray and proton beam inspection systems combines precision metrology with high-energy radiation detection to form a completely electronic alternative to film-based measurements. The XYZ location and vector of pencil-thin beams of radiation can now be measured with unmatched speed and accuracy. Beam vector, profile ...
  • Sensor Type: CCD
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 0.01 - 10 nm
  • # Pixels (Width): 1280 
  • # Pixels (Height): 960 
  • ...
Data Sheet
XRV-124 Detector Phantom
Logos Systems
The XRV family of X-ray and proton beam inspection systems combine precision metrology with high-energy radiation detection to form a completely electronic alternative to film-based measure-ments. The XYZ location and vector of pencil-thin beams of ionizing radiation can now be measured with unmatched speed and accuracy. Beam vector, ...
  • Sensor Type: CCD
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 0.01 - 10 nm
  • # Pixels (Width): 1280 
  • # Pixels (Height): 960 
  • ...
Data Sheet
LPM200 – Laser Propagation Monitor 200
Metrolux GmbH
The LPM200 is designed for the automated determination and monitoring of lasersand the beam parameters of laser beams with long Rayleigh lengths where standard beam profilers do not provide sufficient functionalities. The LPM200 system includes an optical system for imaging the laser beam caustic as well as a linear stage to scan ...
  • Sensor Type: CCD
  • Measurable Sources: CW
  • Wavelength Range: 340 - 1100 nm
  • # Pixels (Width): 1388 
  • # Pixels (Height): 1036 
  • ...
Data Sheet
FM100 – Focus Monitor 100
Metrolux GmbH
Thanks to its versatility the FM100 is already in use for regular quality control of the laser beam in the display and semiconductor industries as well as in the processing of materials in the automotive industry. In addition to the integrated high power attenuator the FM100 has two filter slots for flexible attenuation of laser ...
  • Sensor Type: CCD
  • Measurable Sources: CW
  • Wavelength Range: 248 - 1100 nm
  • # Pixels (Width): 1388 
  • # Pixels (Height): 1036 
  • ...
Data Sheet
BM8304 - Beam Monitor 8304
Metrolux GmbH
Low S/N ratios and a high sensor response linearity are prime attributes of the sensor employed in this Metrolux beam profiler. The Software provides the functions required for the international standards EN-ISO 11145, 11146, 11670 and 13694 that cover aspects of laser light characterization. The beam profiler camera BPC8304 uses a ...
  • Sensor Type: CCD
  • Measurable Sources: CW
  • Wavelength Range: 340 - 1100 nm
  • # Pixels (Width): 1392 
  • # Pixels (Height): 1040 
  • ...
Data Sheet
The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 200 mm in length and down to 55 µm in width. By scanning DataRay’s flagship WinCamD-LCM4 beam profiling camera across the length of the beam using our 200 mm linear stage, the full-featured free software will display a full image of ...
  • Sensor Type: CMOS
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 190 - 1150 nm
  • # Pixels (Width): 2048 
  • # Pixels (Height): 2048 
  • ...
Data Sheet
The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 200 mm in length and down to 55 µm in width. By scanning DataRay’s flagship WinCamD-LCM4 beam profiling camera across the length of the beam using our 200 mm linear stage, the full-featured free software will display a full image of ...
  • Sensor Type: CMOS
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 190 - 1150 nm
  • # Pixels (Width): 2048 
  • # Pixels (Height): 2048 
  • ...
Data Sheet
The Large Beam Profiling System is a complete solution for measuring large beams by illuminating a rotating diffusely reflective surface with the beam and using a high quality lens to reimage the intensity distribution onto the camera sensor. The LBPS profiler overcomes typical problems with this method by eliminating the effect of ...
  • Sensor Type: CMOS
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 355 - 1150 nm
  • # Pixels (Width): 2048 
  • # Pixels (Height): 2048 
  • ...
Data Sheet
The WinCamD-IR-BB laser beam profiler is an imaging solution for lasers in the MWIR and FIR range. With 17 µm pixels, a wavelength range of 2-16 µm, and an integrated shutter, the WinCamD-IR-BB beam profiler offers unparalleled beam profiling capabilities. With a signal-to-noise ratio that exceeds 1000:1, the ...
  • Sensor Type: Microbolometer
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 2000 - 16000 nm
  • # Pixels (Width): 640 
  • # Pixels (Height): 480 
  • ...
Data Sheet
This laser beam profiler from DataRay povides a solution for Thz laser beam measurements in OEM, industrial, and scientific applications. WinCam-THz comes with a full user friendly software suite for laser beam profile measurements. 
  • Sensor Type: CMOS
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 350 - 1150 nm
  • # Pixels (Width): 2048 
  • # Pixels (Height): 2048 
  • ...
Data Sheet
25 x 25 mm CMOS Beam Profiler System, 355 to 1150 nm
  • Sensor Type: CMOS
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 355 - 1150 nm
  • # Pixels (Width): 2048 
  • # Pixels (Height): 2048 
  • ...
Data Sheet
DataRay WinCamD-LCM CMOS laser beam profiler provides USB 3.0 transfer rates and a high-resolution 1-in. detector for applications ranging from OEM integration to R&D. This beam profiler, usable from 190 to 1605 nm, provides 5.5-µm pixels in a 2048 × 2048 active area with an update rate of up to 60 Hz and an optical/TTL ...
  • Sensor Type: CMOS
  • Measurable Sources: CW, Pulsed
  • Wavelength Range: 355 - 1150 nm
  • # Pixels (Width): 2048 
  • # Pixels (Height): 2048 
  • ...
Data Sheet
CMOS camera based laser beam profiler by DataRay Inc.  At just 46x46x11.5 mm, the BladeCam series is the smallest beam profiler on the market! These CMOS cameras can handle wavelengths from 190 to 1605 nm (model-dependent). 
  • Sensor Type: CMOS
  • Measurable Sources: CW
  • Wavelength Range: 190 - 1150 nm
  • # Pixels (Width): 1280 
  • # Pixels (Height): 1024 
  • ...
Data Sheet
CMOS based laser beam profiler system by DataRay Inc. This beam profiler can be used with a wide variety of lasers from UV to Infrared spectral range. 
  • Sensor Type: CMOS
  • Measurable Sources: CW
  • Wavelength Range: 355 - 1605 nm
  • # Pixels (Width): 1280 
  • # Pixels (Height): 1024 
  • ...
Data Sheet
CMOS based laser beam profiler system by DataRay Inc. This beam profiler can be used with a wide variety of lasers from UV to Infrared spectral range. 
  • Sensor Type: CMOS
  • Measurable Sources: CW
  • Wavelength Range: 190 - 1350 nm
  • # Pixels (Width): 2048 
  • # Pixels (Height): 1536 
  • ...
Data Sheet

Did You know?

The CCD/CMOS camera based profilers provide a 3D representation of the beam. Camera-based beam profiling systems consist of a camera and analysis software. The software includes an extensive set of ISO quantitative measurements and features a rich graphical interface, for high accuracy measurements. The advantage of camera-based beam profiling is the real-time viewing and measuring of laser beam structure. The spatial resolution of a camera sensor is an important quantity. With silicon sensors, pixel sizes well below 10um are possible, allowing to measure beam diameters down to the order of 50um. Different wavelength regions require different sensor types. Silicon-based sensors are a good choice for wavelengths in the visible and near-infrared spectral region up to roughly 1 or 1.1um.