BeamPro | Small Pixel Laser Beam Profiler

Specifications

Sensor Type: CMOS
Measurable Sources: CW, Pulsed
Wavelength Range: 375 – 1100 nm
# Pixels (Width): Not Specified
# Pixels (Height): Not Specified
Pixel Size (Width): 1.45 um
Pixel Size (Height): 1.45 um
Max Full Frame Rate: Not Specified
ADC: Other
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Features


  • Wide Model Selection: Includes options for small pixel sizes (down to 1.4 µm), large detection areas (up to 30 mm in diameter), and ultra-compact footprints (as thin as 15 mm).

  • Comprehensive Spectral Range: Models cover wavelengths from 190 nm (UV option) to 1700 nm (SWIR range), ensuring compatibility with diverse laser sources.

  • Robust Performance: Delivers high dynamic range, exceptional signal-to-noise ratio, and reliable measurements under challenging conditions.

  • Advanced Software Integration: Powered by STAR software with live beam property extraction, ISO-compliant calculations, and a client-server interface for remote control.

Applications


  • Beam Diagnostics: Optimized for laser characterization in R&D, manufacturing, and quality control.

  • Advanced Scientific Research: Ideal for precise profiling in spectroscopy, imaging, and photonics.

  • Industrial Applications: Robust solutions for high-power laser measurements and alignment.