BeamPro | Compact Footprint Laser Beam Profiler

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Specifications

Sensor Type: CMOS
Measurable Sources: CW, Pulsed
Wavelength Range: 375 – 1100 nm
# Pixels (Width): 1.45
# Pixels (Height): 1.45
Pixel Size (Width): 1.45 um
Pixel Size (Height): 1.45 um
Max Full Frame Rate: Not Specified
ADC: Other
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Features


  • Comprehensive Profiling: Offers a wide range of models for various beam sizes (10–30 mm) and spectral ranges (190–1700 nm).

  • Compact and Flexible Design: Ultra-thin models (<15 mm) with USB 3.1 or optional GigE connectivity.

  • High Precision: Pixel sizes as small as 1.40 µm with CMOS and InGaAs sensors for detailed profiling.

  • Dynamic Range Options: HDR and synchronization options for enhanced performance.

  • Powerful Software: Live beam analysis, ISO-compliant calculations, advanced background treatment, and easy data export.

Applications


  • Laser System Alignment and Optimization: Ensures precise alignment and performance tuning in laser systems for industrial, medical, and research applications.

  • Beam Quality Analysis: Evaluates beam profiles for quality assurance in manufacturing and laser-based processes.

  • Ultrafast Laser Development: Measures pulse shapes and profiles in femtosecond and picosecond lasers for scientific research.

  • Optical System Testing: Analyzes beam characteristics in optical components and systems, such as lenses, mirrors, and fiber optics.

  • Spectroscopy and Microscopy: Supports beam shaping and quality control in spectroscopy and high-resolution microscopy applications.

  • Remote Sensing and LIDAR: Profiles laser beams for environmental monitoring, geospatial mapping, and autonomous systems.

  • Photonics and Semiconductor Testing: Validates beam parameters in photonic devices and semiconductor inspection systems.