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Scanning Slit Beam Profilers

DataRay Inc. offers Beam'R2 Single Plane Scanning Slit Beam Profiler providing affordable, compact, and precise beam profiling with resolutions down to 0.1 um. These laser beam profilers can be used with a wide variety of laser sources.  DataRay’s Beam'R2 is well suited for many laser beam profiling applications. With both ...

Specifications

Detector Type: Si, InGaAs
Wavelength Range: 190-2500nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
Part Number (Model Dependent): S-BR2-XX
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Data Sheet
DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel.  This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to ...

Specifications

Detector Type: Si, InGaAs, Si+InGaAs, Other
Wavelength Range: 190-2500nm
Beam Waist Diameter Measurement: Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other
M^2 Measurement Capability: Yes
Minimum PC Requirements: Windows, 2 GB RAM, USB 2.0/3.0 port
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Data Sheet
With experience measuring laser beam profiles using tedious scanning techniques to sample the beam across x and y axes; LOD has invented a novel method of measuring any laser beam with one click of the LOD Image Profiler.  PIN photodiodes, expensive translations stages, software to run the stages and 2-4 hours of time is ...

Specifications

Detector Type: Other
Wavelength Range: 1-1nm
Beam Waist Diameter Measurement: Other
M^2 Measurement Capability: Yes
Data Sheet
Duma\'s High Power Laser Measuring Device is a robust all-in-one instrument with built-in state-of-the-art air-cooled beam dump, operating from 350 - 1600 nm lasers. It will measure M², BPP (Beam Propagation Parameters), Beam size at its focal position down to less than 100 microns. A unique feature allows measurement of ...

Specifications

Detector Type: Si
Wavelength Range: 350-1100nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
Data Sheet
The measuring technique is based on a multiple scanning knife-edge technology, combined with a tomographic image reconstruction for the creation of the 2D/3D display. When the drum spins, the knife-edges cut across the beam in an orthogonal plane to the direction of propagation. A stationary large detector inside the spinning drum ...

Specifications

Detector Type: Si, InGaAs
Wavelength Range: 190-2700nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
Data Sheet
The M² Beam provides analytical and graphical capability to measure the 2 axis M² figure of merit waist size and location of CW lasers. The M² factor is measured in accordance with the proposed ISO/CD 11 146.Additionaly, the instrument measures the profile width, position and power of the laser beam at intersection points along the ...

Specifications

Detector Type: Si, InGaAs
Wavelength Range: 400-1800nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
Data Sheet
High precision beam diagnostics for CW lasers. A wide spectral range from deep UV through 2700nm. Wide dynamic range, beam size measurements down to 2 µm size and up to 10mm with 0.1 µm resolution. The new USB version offers enhanced operation of the Beam Analyzer series, including: USB 2.0 interface, 12 bit device, and ...

Specifications

Detector Type: Si, InGaAs, Si+InGaAs
Wavelength Range: 350-2700nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width
M^2 Measurement Capability: No
Data Sheet
There are 8 different Scanning Slit Beam Profilers from suppliers and manufacturers listed in this category. In just a few clicks you can compare different Scanning Slit Beam Profilers with each other and get an accurate quote based on your needs and specifications. Please note that the prices of Scanning Slit Beam Profilers vary significantly for different products based on various factors including technical parameters, features, brand name, etc. Please contact suppliers directly to inquire about the details and accurate pricing information for any product model. Simply navigate to the product page of interest and use the orange button to directly reach out to the respective supplier with one click.

Did You know?

Scanning-slit profilers use a narrow slit instead of a single knife edge. In this case, the intensity is integrated over the width of the slit. The resulting measurement is equivalent to the original cross section convolved with the profile of the slit. Scanning beam profilers are most suitable for beam profiles which are not too far from Gaussian, because the recorded signal is usually integrated in one spatial direction, so that the reconstruction of more structured beam shapes may not be perfect. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. An important advantage of the concept of scanning is that the photodetector used does not need to have a great spatial resolution, so that detectors for very different wavelength regions can easily be used.