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- BeamMap2 – Multi-Plane Scanning Slit Beam Profiler
BeamMap2 – Multi-Plane Scanning Slit Beam Profiler
OVERVIEW
DataRay Inc offers the BeamMap2 providing affordable, compact, and precise beam profiling with resolutions to 0.1 µm. These profilers can be used with a wide variety of laser sources from 190nm to 2500nm depending on the model.
SPECIFICATION
- Detector Type: Si, InGaAs, Si+InGaAs, Other
- Wavelength Range: 190 - 2500 nm
- Beam Waist Diameter Measurement: Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other
- M^2 Measurement Capability: Yes
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ μm ≥ [500/(PRR in kHz)]
KEY FEATURES
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Multiple plane spacing options available – please review this worksheet to identify the correct - plane spacing for your application
Beam diameters 5 μm to 4 mm, to 1 μm in Knife Edge
- Port-powered USB 2.0; flexible 3 m cable, no power brick
- 0.1 μm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time multiple Z plane scanning slit system
- Real-time XYZ profiles, Focus position
- Real-time M², Divergence, Collimation, Alignment
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