BeamMap2 – XYZΘΦ Scanning Slit Beam Profiler
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
United States
-
Sold by:
-
On FindLight:
since 2014
Description
DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel.
This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations. The BeamMap2’s unique, patented design is most advantageous for real-time measurement of focus position, M2, beam divergence and pointing.
BeamMap2 – XYZΘΦ Scanning Slit Beam Profiler
Specifications |
|
|---|---|
| Detector Type: | Si, InGaAs, Si+InGaAs, Other |
| Wavelength Range: | 190 – 2500 nm |
| Beam Waist Diameter Measurement: | Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other |
| M^2 Measurement Capability: | Yes |
| Maximum Power & Irradiance: | 1 W Total & 0.5 mW/µm² |
| Wavelength (Si + InGaAs Detectors): | 190 to 1800 nm |
| Wavelength (Si + InGaAs (extended) Detectors): | 190 to 2300 or 2500 nm |
| Plane Spacing: | 50um: -50, 0, 50, 200um | 100um: -100, 0, 100, 400um | 250um: -250, 0, 250, 1000um | 500um: -500, 0, 500, 2000um | 750um: -750, 0, 750, 3000um |
| Beam Waist Position Measurement: | ± 20 µm best in X, Y, and Z — contact DataRay for recommendation |
| Measured Sources: | CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)] |
| Resolution Accuracy: | 0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm |
| M² Measurement: | 1 to > 20, ± 5% |
| Wavelength (InGaAs Detector): | 650 to 1800 nm |
| Divergence/Collimation, Pointing: | 1 mrad best — contact DataRay for recommendation |
| Gain Range: | 1,000:1 Switched 4,096:1 ADC range |
| Displayed Graphics: | X-Y-Z Position & Profiles, Zoom x1 to x16 |
| Update Rate: | ~5 Hz |
| Pass/Fail Display: | On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
| Averaging: | User selectable running average (1 to 8 samples) |
| Statistics: | Min., Max., Mean, Standard Deviation; Log data over extended periods |
| XY Profile & Centroid: | Beam Wander display and logging |
| Minimum PC Requirements: | Windows, 2 GB RAM, USB 2.0/3.0 port |
Features
- Multiple z-plane scanning
- XYZ profiles, plus θ-Φ
- Focus position and diameter
- Real-time M2, Pointing, and Divergence
- Measure divergence of well-collimated beam in real-time with BeamMap2-Collimate
- Identify focus with ±1 µm repeatability (beam dependent)
- Optional LensPlate2 for reaching inaccessible beam waists and reimaging waveguides
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
Frequently Asked Questions
The BeamMap2 is a real-time slit scanning system that uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations.
The BeamMap2's unique, patented design is most advantageous for real-time measurement of focus position, M2, beam divergence, and pointing.
The BeamMap2 is suitable for laser printing and marking, medical lasers, diode laser systems, fiber optic telecom assembly focusing, and development, production, and field service.
The BeamMap2 has a 5 Hz update rate (user adjustable 2-12 Hz).
The BeamMap2 has a resolution up to 0.1 µm.