Frequently Asked Questions

The BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler is a real-time slit scanning system that uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations.

The features of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler include 190 to 1150 nm, Silicon detector, 650 to 1800 nm, InGaAs detector, 1000 to 2300 or 2500 nm, InGaAs (extended) detector, beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs), 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals, 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals, real-time ±1 mr real-time Divergence and Pointing measurement accuracy, port-powered USB 2.0; flexible 3 m cable; no power brick, 0.1 µm sampling and resolution, linear & log X-Y profiles, centroid, profile zoom & slit width compensation, real-time multiple Z plane scanning slit system, real-time XYZ profiles, Focus position, real-time M², Divergence, Collimation, Alignment.

The applications of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler include laser printing & marking, medical lasers, diode laser systems, fiber optic telecom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends, development, production, field service, CW; Pulsed lasers, Φ μm ≥ [500/(PRR in kHz)].

The configuration of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler comprises a compact, USB 2.0, port-powered head, 3 m cable and software for Windows XP & Vista.

The True2D™ Slits Profile in the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler is a thin, True2D™ slits profile that helps to profile tightly focused beams more accurately. 0.4 μm thick metallic multilayer films on a sapphire substrate avoid the tunnel effect of air slits.

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