Description
DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel.
This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations. The BeamMap2’s unique, patented design is most advantageous for real-time measurement of focus position, M2, beam divergence and pointing.
BeamMap2-CM Collimate – Multi-Plane Scanning Slit Beam Profiler
Specifications
| Detector Type: | Si, InGaAs, Si+InGaAs, Other |
|---|---|
| Wavelength Range: | 190 – 2500 nm |
| Beam Waist Diameter Measurement: | Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other |
| M^2 Measurement Capability: | Yes |
| Minimum PC Requirements: | Windows, 2 GB RAM, USB 2.0/3.0 port |
| XY Profile & Centroid: | Beam Wander display and logging |
| Statistics: | Min., Max., Mean, Standard Deviation; Log data over extended periods |
| Averaging: | User selectable running average (1 to 8 samples) |
| Pass/Fail Display: | On-screen selectable Pass/Fail colors. Ideal for QA & Production. |
| Update Rate: | ~5 Hz |
| Displayed Graphics: | X-Y-Z Position & Profiles, Zoom x1 to x16 |
| Gain Range: | 1,000:1 Switched 4,096:1 ADC range |
| Divergence/Collimation, Pointing: | 1 mrad best — contact DataRay for recommendation |
| Wavelength (InGaAs Detector): | 650 to 1800 nm |
| M² Measurement: | 1 to > 20, ± 5% |
| Resolution Accuracy: | 0.1 µm or 0.05% of scan range ± < 2% ± = 0.5 µm |
| Measured Sources: | CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)] |
| Beam Waist Position Measurement: | ± 20 µm best in X, Y, and Z — contact DataRay for recommendation |
| Plane Spacing: | 5 mm: -5, 0, +5, +20 mm |
| Wavelength (Si + InGaAs (extended) Detectors): | 190 to 2300 or 2500 nm |
| Wavelength (Si + InGaAs Detectors): | 190 to 1800 nm |
| Maximum Power & Irradiance: | 1 W Total & 0.5 mW/µm² |
Download Data Sheet
Features
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs)
- 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals
- 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals
- Real-time ±1 mr real-time Divergence and Pointing measurement accuracy
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time multiple Z plane scanning slit system
- Real-time XYZ profiles, Focus position
- Real-time M², Divergence, Collimation, Alignment
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telecom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ μm ≥ [500/(PRR in kHz)]
Frequently Asked Questions
What is the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler?
The BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler is a real-time slit scanning system that uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations.
What are the features of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler?
The features of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler include 190 to 1150 nm, Silicon detector, 650 to 1800 nm, InGaAs detector, 1000 to 2300 or 2500 nm, InGaAs (extended) detector, beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs), 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals, 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals, real-time ±1 mr real-time Divergence and Pointing measurement accuracy, port-powered USB 2.0; flexible 3 m cable; no power brick, 0.1 µm sampling and resolution, linear & log X-Y profiles, centroid, profile zoom & slit width compensation, real-time multiple Z plane scanning slit system, real-time XYZ profiles, Focus position, real-time M², Divergence, Collimation, Alignment.
What are the applications of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler?
The applications of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler include laser printing & marking, medical lasers, diode laser systems, fiber optic telecom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends, development, production, field service, CW; Pulsed lasers, Φ μm ≥ [500/(PRR in kHz)].
What is the configuration of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler?
The configuration of the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler comprises a compact, USB 2.0, port-powered head, 3 m cable and software for Windows XP & Vista.
What is the True2D™ Slits Profile in the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler?
The True2D™ Slits Profile in the BeamMap2-CM Collimate - Multi-Plane Scanning Slit Beam Profiler is a thin, True2D™ slits profile that helps to profile tightly focused beams more accurately. 0.4 μm thick metallic multilayer films on a sapphire substrate avoid the tunnel effect of air slits.
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