Beam\'R2 – Single Plane Scanning Slit Beam Profiler
Product Description: DataRay Inc. offers Beam'R2 Single Plane Scanning Slit Beam Profiler providing affordable, compact, and precise beam profiling with resolutions down to 0.1 um. These laser beam profilers can be used with a wide variety of laser sources.
Beam’R2™ single plane XY scanning of 2.5 & 25 um slit pairs (5 & 50 um for longer wavelengths).
High dynamic range Slit mode plus 0.1 um resolution Knife-Edge mode, in one head:
-Linear & log X-Y profiles, centroid
-Resolution 0.1 um
-Beams diameters 2 um to 4 mm. Auto-zoom on profiles. Auto slit width compensation.
-Detector options, 190 nm to 2.5 um
BeamMap2™ adds multiple z-plane scanning to allow the measurement of:
-XYZ profiles, Focus position & diameter
-Real-time M2, Divergence, Collimation
By measuring in multiple planes in z, the propagation direction, BeamMap can identify the focus position with ±<1 um repeatability. This dramatically speeds up real-time diagnosis of focusing and alignment errors & the setting of multiple assemblies to the same focus.
[Protected under US Patent # 6,313,910.]
Configuration: All systems comprise a compact, USB 2.0, port-powered head, 3 m cable and software
for Windows XP & Vista.
True2D™ Slits: Profile tightly focused beams more accurately with thin, True2D™ slits. 0.4 um thick metallic multilayer films on a sapphire substrate avoid the tunnel effect of air slits. Air slits are frequently
deeper than they are wide, and can buckle under high irradiance.
- Detector Type: Si, InGaAs
- Wavelength Range: 190 - 2500 nm
- Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
- M^2 Measurement Capability: Yes
- Part Number (Model Dependent): S-BR2-XX
Laser & Laser Assembly Verification, e.g., Precision Focused Assemblies for:
Diode Laser instruments … etc.
Lens Focus Testing for short focal lengths.
Fiber Optic Telecom assembly focusing.
LensPlate™ option for re-imaging waveguides and fiber ends.
BR2-Si: Silicon detector, 2.5 um & 25 um XY dual axis Slits
BR2-IGA: InGaAs detector, 5 um & 50 um XY dual axis Slits
BR2-IGA-X.X:InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis Slits
BR2-DD: Dual Detector Si & InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis
Slits wavelength response from 190 – 1800 nm in a single unit
BR2-DD-X.X: Dual Detector Si & InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis
Slits wavelength response from 190 – 2500 nm in a single unit
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BeamMap2 – Multi-Plane Scanning Slit Beam ProfilerDataRay Inc.
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