Beam R2 – Single Plane Scanning Slit Beam Profiler

Specifications

Detector Type: Si, InGaAs
Wavelength Range: 190 – 2500 nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
Part Number (Model Dependent): S-BR2-XX
Wavelength Options: 190-1150 nm, 650-1800 nm, 190- 1800 nm, 190-2500 nm
CW Or Pulsed: CW, Pulsed Minimum PRR ≈ [500/ (Beam diameter in µm)] kHz
M2 Measurement: 1 to >20, ± 5%
Real-Time Update: 5 Hz
Gain Range: 32 dB
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Features

Beam'R2 Single Plane Scanning Slit Beam profiler offers the following options:
 
  • BR2-Si: Silicon detector, 2.5 um & 25 um XY dual axis Slits
  • BR2-IGA: InGaAs detector, 5 um & 50 um XY dual axis Slits
  • BR2-IGA-X.X: InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis Slits
  • BR2-DD: Dual Detector Si & InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis. Slits wavelength response from 190 – 1800 nm in a single unit
  • BR2-DD-X.X: Dual Detector Si & InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis. Slits wavelength response from 190 – 2500 nm in a single unit
  • ISO compliant beam diameter measurements
  • Port-powered USB2.0
  • Auto-gain function
  • Optional stage accessory for ISO 11146
  • compliant M2 measurements.
  • True2D slits
  • Resolution up to 0.1 µm
  • Detector options, 190 – 2500 nm
  • 5 Hz update rate (user adjustable 2-12 Hz)
  • Measure high repetition pulsed lasers
  • Pulsed Minimum PRR = [500/(beam
  • diameter in µm)] kHz

Applications

  • Laser & Laser Assembly Verification, e.g., Precision Focused Assemblies for: laser printing/marking, medical lasers, diode laser instruments
  • Lens Focus Testing for short focal lengths
  • Fiber Optic Telecom assembly focusing
  • LensPlate™ option for re-imaging waveguides and fiber ends
  • Very small laser beam profiling
  • Optical assembly and instrument alignment
  • OEM integration
  • Lens focal length testing
  • Real-time diagnosis of focusing and alignment errors
  • Real-time setting of multiple assemblies to the same focus