Beam\'R2 – Single Plane Scanning Slit Beam Profiler

Product Description: DataRay Inc. offers Beam'R2 Single Plane Scanning Slit Beam Profiler providing affordable, compact, and precise beam profiling with resolutions down to 0.1 um. These laser beam profilers can be used with a wide variety of laser sources.

Beam’R2™ single plane XY scanning of 2.5 & 25 um slit pairs (5 & 50 um for longer wavelengths).
High dynamic range Slit mode plus 0.1 um resolution Knife-Edge mode, in one head:
-Linear & log X-Y profiles, centroid
-Resolution 0.1 um
-Beams diameters 2 um to 4 mm. Auto-zoom on profiles. Auto slit width compensation.
-Detector options, 190 nm to 2.5 um

BeamMap2™ adds multiple z-plane scanning to allow the measurement of:
-XYZ profiles, Focus position & diameter
-Real-time M2, Divergence, Collimation

By measuring in multiple planes in z, the propagation direction, BeamMap can identify the focus position with ±<1 um repeatability. This dramatically speeds up real-time diagnosis of focusing and alignment errors & the setting of multiple assemblies to the same focus.
[Protected under US Patent # 6,313,910.]

Configuration: All systems comprise a compact, USB 2.0, port-powered head, 3 m cable and software
for Windows XP & Vista.

True2D™ Slits: Profile tightly focused beams more accurately with thin, True2D™ slits. 0.4 um thick metallic multilayer films on a sapphire substrate avoid the tunnel effect of air slits. Air slits are frequently
deeper than they are wide, and can buckle under high irradiance.