Beam R2 – Single Plane Scanning Slit Beam Profiler
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Ships from:
United States
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Sold by:
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On FindLight:
since 2014
Description
DataRay Inc. offers Beam'R2 Single Plane Scanning Slit Beam Profiler providing affordable, compact, and precise beam profiling with resolutions down to 0.1 um. These laser beam profilers can be used with a wide variety of laser sources.
DataRay’s Beam'R2 is well suited for many laser beam profiling applications. With both standard 2.5 µm slits and larger knife-edge slits, the Beam'R2 is capable of measuring beams with diameters as small as 2 µm. With options for both silicon and InGaAs or extended InGaAs, the Beam'R2 can profile beams from 190 nm to 2500 nm. Scanning slit instruments offer much higher resolution than camera based systems.
DataRay’s Beam'R2 is well suited for many laser beam profiling applications. With both standard 2.5 µm slits and larger knife-edge slits, the Beam'R2 is capable of measuring beams with diameters as small as 2 µm. With options for both silicon and InGaAs or extended InGaAs, the Beam'R2 can profile beams from 190 nm to 2500 nm. Scanning slit instruments offer much higher resolution than camera based systems.
DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations. The BeamMap2’s unique, patented design is most advantageous for real-time measurement of focus position, M2, beam divergence and pointing.
Beam’R2™ single plane XY scanning of 2.5 & 25 um slit pairs (5 & 50 um for longer wavelengths). High dynamic range Slit mode plus 0.1 um resolution
Knife-Edge mode, in one head:
Linear & log X-Y profiles, centroid
Resolution 0.1 um
Beams diameters 2 um to 4 mm. Auto-zoom on profiles. Auto slit width compensation.
Detector options, 190 nm to 2.5 um
BeamMap2™ adds multiple z-plane scanning to allow the measurement of:
XYZ profiles, Focus position & diameter
Real-time M2, Divergence, Collimation
By measuring in multiple planes in z, the propagation direction, BeamMap can identify the focus position with ±<1 um repeatability. This dramatically speeds up real-time diagnosis of focusing and alignment errors & the setting of multiple assemblies to the same focus.
Linear & log X-Y profiles, centroid
Resolution 0.1 um
Beams diameters 2 um to 4 mm. Auto-zoom on profiles. Auto slit width compensation.
Detector options, 190 nm to 2.5 um
BeamMap2™ adds multiple z-plane scanning to allow the measurement of:
XYZ profiles, Focus position & diameter
Real-time M2, Divergence, Collimation
By measuring in multiple planes in z, the propagation direction, BeamMap can identify the focus position with ±<1 um repeatability. This dramatically speeds up real-time diagnosis of focusing and alignment errors & the setting of multiple assemblies to the same focus.
Configuration:
All systems comprise a compact, USB 2.0, port-powered head, 3 m cable and software
for Windows XP & Vista.
All systems comprise a compact, USB 2.0, port-powered head, 3 m cable and software
for Windows XP & Vista.
True 2D™ Slits:
Profile tightly focused beams more accurately with thin, True2D™ slits. 0.4 um thick metallic multilayer films on a sapphire substrate avoid the tunnel effect of air slits. Air slits are frequently deeper than they are wide, and can buckle under high irradiance.
Profile tightly focused beams more accurately with thin, True2D™ slits. 0.4 um thick metallic multilayer films on a sapphire substrate avoid the tunnel effect of air slits. Air slits are frequently deeper than they are wide, and can buckle under high irradiance.
Beam R2 – Single Plane Scanning Slit Beam Profiler
Specifications |
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|---|---|
| Detector Type: | Si, InGaAs |
| Wavelength Range: | 190 – 2500 nm |
| Beam Waist Diameter Measurement: | Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width |
| M^2 Measurement Capability: | Yes |
| Part Number (Model Dependent): | S-BR2-XX |
| Wavelength Options: | 190-1150 nm, 650-1800 nm, 190- 1800 nm, 190-2500 nm |
| CW Or Pulsed: | CW, Pulsed Minimum PRR ≈ [500/ (Beam diameter in µm)] kHz |
| M2 Measurement: | 1 to >20, ± 5% |
| Real-Time Update: | 5 Hz |
| Gain Range: | 32 dB |
Features
Beam'R2 Single Plane Scanning Slit Beam profiler offers the following options:
- BR2-Si: Silicon detector, 2.5 um & 25 um XY dual axis Slits
- BR2-IGA: InGaAs detector, 5 um & 50 um XY dual axis Slits
- BR2-IGA-X.X: InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis Slits
- BR2-DD: Dual Detector Si & InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis. Slits wavelength response from 190 – 1800 nm in a single unit
- BR2-DD-X.X: Dual Detector Si & InGaAs extended λ detector options to 2.5 um; 5 um & 50 um XY dual axis. Slits wavelength response from 190 – 2500 nm in a single unit
- ISO compliant beam diameter measurements
- Port-powered USB2.0
- Auto-gain function
- Optional stage accessory for ISO 11146
- compliant M2 measurements.
- True2D slits
- Resolution up to 0.1 µm
- Detector options, 190 – 2500 nm
- 5 Hz update rate (user adjustable 2-12 Hz)
- Measure high repetition pulsed lasers
- Pulsed Minimum PRR = [500/(beam
- diameter in µm)] kHz
Applications
- Laser & Laser Assembly Verification, e.g., Precision Focused Assemblies for: laser printing/marking, medical lasers, diode laser instruments
- Lens Focus Testing for short focal lengths
- Fiber Optic Telecom assembly focusing
- LensPlate™ option for re-imaging waveguides and fiber ends
- Very small laser beam profiling
- Optical assembly and instrument alignment
- OEM integration
- Lens focal length testing
- Real-time diagnosis of focusing and alignment errors
- Real-time setting of multiple assemblies to the same focus
Frequently Asked Questions
The Beam'R2 Single Plane Scanning Slit Beam Profiler has a resolution down to 0.1 um.
The Beam'R2 can measure beams with diameters as small as 2 µm and as large as 4 mm.
The BeamMap2 extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. It uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations.
The Beam'R2 is available with silicon and InGaAs or extended InGaAs detector options, with wavelength responses from 190 nm to 2500 nm.
The Beam'R2 has a 5 Hz update rate, which can be adjusted by the user to between 2-12 Hz.