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Laser Beam Analysis Tools

Updated with USB3 connectivity and other improvements, the BladeCam2™ offers an enhanced BladeCam™ beam profiling experience. With pixel size to 3.2 µm, the high resolution and highly compact BladeCam2™ beam profilers have a thickness of only 0.50” (12.84 mm) for insertion into tight optical trains and OEM applications.  ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW
Wavelength Range: 355-1,150nm
# Pixels (Width): 1,280
# Pixels (Height): 1,024
...
Data Sheet
Updated with USB3 connectivity and other improvements, the BladeCam2™ offers an enhanced BladeCam™ beam profiling experience. With pixel size to 3.2 µm, the high resolution and highly compact BladeCam2™ beam profilers have a thickness of only 0.50” (12.84 mm) for insertion into tight optical trains and OEM applications.    ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW
Wavelength Range: 355-1,150nm
# Pixels (Width): 2,048
# Pixels (Height): 1,536
...
Data Sheet
The ILMS is specially designed for profiling focused, high-power industrial lasers. This system combines reimaging/magnification optics, a polarization preserving beam sampler, and a DataRay beam profiler to measure small beam waists which would otherwise damage a traditional profiling system. Magnification of the focused beam allows ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW, Pulsed
Wavelength Range: 190-16,000nm
# Pixels (Width): 2,048
# Pixels (Height): 2,048
...
Data Sheet
The WinCamD-QD series uses colloidal quantum dot sensors to provide high quality beam profiling for visible, SWIR, and eSWIR sources. With 15 µm pixels, a wavelength range as wide as 350-2000 nm, and a global shutter, the WinCamD-QD series offers unparalleled beam profiling capabilities.  With a signal-to-noise ratio that ...

Specifications

Sensor Type: Colloidal Quantum Dot (CQD)
Measurable Sources: CW
Wavelength Range: 400-1,700nm
# Pixels (Width): 1,920
# Pixels (Height): 1,080
...
Data Sheet
DataRay Innovation: The company that brought you the first Windows‐based CCD beam profiler, the first Camera for confined spaces, the first software slider exposure and electronic auto‐shutter, the first standard window‐free CCD for no fringing, the first auto‐orientation on the ellipse & the first USB 2.0 beam profiling camera … ...

Specifications

Wavelength Range (UV-FS): 190 nm - 2200 nm
Wavelength Range (BaF2): 200 nm - 11 µm
Wavelength Range (CaF2): 200 nm - 8 µm
Wavelength Range (ZnSe): 600 nm - 16 µm
Average Transmission (UV-FS): 0.05 %
...
Data Sheet
This laser beam profiler from DataRay provides a solution for THz laser beam measurements in OEM, industrial, and scientific applications. WinCam-THz comes with a full user friendly software suite for laser beam profile measurements.   Note: This product requires 64-bit Windows 7, 8/8.1, or 10

Specifications

Sensor Type: CMOS
Measurable Sources: Pulsed
Wavelength Range: 355-1150nm
# Pixels (Width): 2048
# Pixels (Height): 2048
...
Data Sheet
Using the same sensor as the WinCamD-LCM (11.3 x 11.3 mm active area, 4.2 Mpixels, 5.5 x 5.5 µm pixels, global shutter), the WinCamD-GCM utilizes GigE Vision for longer range applications (cable lengths up to ~100m).   The WinCamD-GCM is paired with DataRay’s full-featured software which has no license fees, unlimited ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW
Wavelength Range: 355-1,150nm
# Pixels (Width): 2,048
# Pixels (Height): 2,048
...
Data Sheet
CamIR Adapter is a cost-effective Telecom C-band NIR image converter by DataRay Inc., the industry leader is design and manufacture of laser beam profilers.   Technology: A proprietary phosphor converts 1480-1605 nm photons to Silicon CMOS/ CCD detectable wavelengths image to the attached CMOS/CCD camera at a ...

Specifications

Active Area: 27.5 mm
IR Spectral Sensitivity: 1480 - 1605 nm (see curve)
Peak IR Sensitivity: 1510/1540 nm (see curve)
Maximum Resolution: 12 lp/mm over active area
Converter IR Output: 950 - 1075 nm
...
Data Sheet
UV converter by DataRay Inc used in light source diagnostic applications.   The UV beam impinges on a custom thin crystal faceplate which fluoresces in the visible.This crystal fluorescence is reimaged onto the camera.Coated crystal option for coherence lengths ≥1 mm.

Specifications

Part Number (Dependent On Model): BSFXX-X-XXX
Aperture (BSF08): 6.4 x 4.8 mm
Aperture (BSF12): 9.6 x 7.2 mm
Aperture (BSF23): 19.2 x 13.8 mm
OAL X Diam. (BSF08): 89 x 35 mm
...
Data Sheet
The WinCamD-IR-BB laser beam profiler is an imaging solution for lasers in the MWIR and FIR range. With 17 µm pixels, a wavelength range of 2-16 µm, and an integrated shutter, the WinCamD-IR-BB beam profiler offers unparalleled beam profiling capabilities.  With a signal-to-noise ratio that exceeds 1000:1, the WinCamD-IR-BB ...

Specifications

Sensor Type: Microbolometer
Measurable Sources: CW, Pulsed
Wavelength Range: 2000-16000nm
# Pixels (Width): 640
# Pixels (Height): 480
...
Data Sheet
This is a Large Laser Beam Profiling System offered directly by DataRay, Inc. The Large Beam Profiling System is a complete solution for measuring large beams by illuminating a rotating diffusely reflective surface with the beam and using a high quality lens to reimage the intensity distribution onto the camera ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW, Pulsed
Wavelength Range: 355-1150nm
# Pixels (Width): 2048
# Pixels (Height): 2048
...
Data Sheet
The Line Laser Profiling System (LLPS) is a complete solution for analyzing line lasers up to 1000 mm in length and down to 55 µm in width. By scanning DataRay's flagship WinCamD-LCM beam profiling camera across the length of the beam using stages up to 1000mm in length, the full-featured free software will display a full image of ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW, Pulsed
Wavelength Range: 190-1150nm
# Pixels (Width): 2048
# Pixels (Height): 2048
...
Data Sheet
DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel.  This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to ...

Specifications

Detector Type: Si, InGaAs, Si+InGaAs, Other
Wavelength Range: 190-2500nm
Beam Waist Diameter Measurement: Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other
M^2 Measurement Capability: Yes
Minimum PC Requirements: Windows, 2 GB RAM, USB 2.0/3.0 port
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Data Sheet
DataRay Inc. offers Beam'R2 Single Plane Scanning Slit Beam Profiler providing affordable, compact, and precise beam profiling with resolutions down to 0.1 um. These laser beam profilers can be used with a wide variety of laser sources.  DataRay’s Beam'R2 is well suited for many laser beam profiling applications. With both ...

Specifications

Detector Type: Si, InGaAs
Wavelength Range: 190-2500nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
Part Number (Model Dependent): S-BR2-XX
...
Data Sheet
DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel.  This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to ...

Specifications

Detector Type: Si, InGaAs, Si+InGaAs, Other
Wavelength Range: 190-2500nm
Beam Waist Diameter Measurement: Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other
M^2 Measurement Capability: Yes
Maximum Power & Irradiance: 1 W Total & 0.5 mW/µm²
...
Data Sheet
DataRay Innovation: The company that brought you the first Windows‐based CCD beam profiler, the first Camera for confined spaces, the first software slider exposure and electronic auto‐shutter, the first standard window‐free CCD for no fringing, the first auto‐orientation on the ellipse & the first USB 2.0 beam profiling camera ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW, Pulsed
Wavelength Range: 355-1150nm
# Pixels (Width): 2048
# Pixels (Height): 2048
...
Data Sheet
SID4 UHR Ultra-High-Resolution wavefront sensor is adapted for optics metrology needs. It combines the SID4 ease of implementation with high sampling and resolution. Its large aperture allows to get a live wavefront measurement over the complete sample under test. The SID4 UHR is optimized for surface inspection (roughness, high ...

Specifications

Wavelength Range: 400-1100nm
# Pixels (Width): 554
# Pixels (Height): 554
Lenslet Pitch: 27.6 um
Wavefront Accuracy: Other
...
Data Sheet
Designed for life science and material inspection microscopes, SID4-sC8 brings fast, accurate and truly quantitative phase measurement in a compact, plug-and-play solution. Biologists will benefit from label-free cell imaging, high sensitivity and automatic segmentation, while material scientists will have access to accurate ...

Specifications

Wavelength Range: 400-1000nm
# Pixels (Width): 852
# Pixels (Height): 720
Lenslet Pitch: 19.5 um
Wavefront Accuracy: <= lambda/20
...
Data Sheet
The SID4 HR brings ultra-high phase sampling (416 x 360) and high dynamic range (500 µm PV) to the most demanding wavefront measurement applications. Its large aperture and extreme wavefront sensitivity makes it perfectly suited to direct measurement of large diverging beams without relay optics.

Specifications

Wavelength Range: 400-1100nm
# Pixels (Width): 360
# Pixels (Height): 416
Lenslet Pitch: 24 um
Wavefront Accuracy: <= lambda/20
...
Data Sheet
Phasics' wavefront sensors simultaneously provide both phase and intensity measurements with unrivalled high resolution. The SID4 wavefront sensor combined with its beam-analysis software delivers a complete diagnostic of the laser: laser beam quality parameters (M2, waist size, and position, ...), wavefront aberrations and intensity ...

Specifications

Sensor Type: CMOS, Microbolometer, InGaAs
Measurable Sources: CW, Pulsed
Wavelength Range: 190-14000nm
# Pixels (Width): up to 850
# Pixels (Height): up to 720
...
Data Sheet
The SID4 DWIR is the first off-the-shelf high-resolution wavefront sensor for dual-band infrared from 3 to 5 µm and 8 to 14 µm. It is well suited to characterize IR optics, blackbody sources, 3.39 µm or 10.6 µm laser beams, and systems.

Specifications

Wavelength Range: 3000-14000nm
# Pixels (Width): 160
# Pixels (Height): 120
Lenslet Pitch: 60 um
Wavefront Accuracy: <= lambda/20
...
Data Sheet
The SID4 SWIR HR wavefront sensor integrates Phasics' patented technology with an InGaAs detector. Thanks to its ultra-high spatial resolution (160 x 128 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7 µm. SID4 SWIR HR is an innovative solution for testing SWIR optical systems ...

Specifications

Wavelength Range: 900-1700nm
# Pixels (Width): 160
# Pixels (Height): 128
Lenslet Pitch: 60 um
Wavefront Accuracy: <= lambda/15
...
Data Sheet
ALPAO Shack–Hartmann (SH) wavefront sensors (WFS) are the only range of WFS specifically designed for Adaptive Optics (AO). They feature excellent performances to fit with every adaptive optics system. Sensitivity, speed, and spectral range can be chosen depending on your needs. All ALPAO SHs perfectly fit with ALPAO Deformable ...

Specifications

Wavelength Range: 350-2000nm
# Pixels (Width): --
# Pixels (Height): --
Lenslet Pitch: -- um
Wavefront Accuracy: Other
...
Data Sheet
The laser beam profiler displays and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers - ultraviolet, visible, infrared, continuous wave, pulsed, high-power, low-power - there is an assortment of instrumentation for measuring laser ...

Specifications

Sensor Type: CMOS
Measurable Sources: CW
Wavelength Range: 300-1100nm
# Pixels (Width): 2400
# Pixels (Height): 2400
...
Data Sheet
Dynamic Optics Shack Hartmann wavefront sensor offers the best compromise between fast acquisition (up to 1KHz with 8 x 8 centroids) and ease of use.

Specifications

Wavelength Range: 350-1000nm
# Pixels (Width): 1535
# Pixels (Height): 1216
Lenslet Pitch: 150 um
Wavefront Accuracy: Other
...
Data Sheet

Frequently Asked Questions

Beam characterization refers to the process of measuring and analyzing the properties of a laser beam, including its intensity, shape, size, and divergence.

Accurate beam characterization is essential for optimizing laser system performance, ensuring product quality, and maintaining consistent results. It can also help with troubleshooting and diagnosing issues in laser systems.

Some common techniques for beam characterization include using beam profilers, power meters, energy meters, and spectrometers. Each technique offers unique insights into the properties of the laser beam.

When selecting a beam profiler, it's important to consider factors such as beam size, wavelength range, sensitivity, and measurement speed. It's also important to choose a profiler that is compatible with your laser system and offers the necessary software and analysis tools.

Yes, beam characterization can help identify areas for improvement in your laser system, such as optimizing beam quality, reducing beam divergence, and minimizing energy loss. By addressing these issues, you can improve your system's overall performance and efficiency.

Beam profiling is the process of measuring the characteristics of a laser beam, while beam shaping is the process of manipulating the laser beam to achieve a desired shape or pattern.

Using a laser beam profiler can help improve the quality of laser-based processes by ensuring that the laser beam is properly characterized and optimized for the specific application.

Yes, many modern beam profiling systems are capable of real-time measurements, allowing users to monitor and adjust the laser beam characteristics as needed during a process.

Find the right laser beam profiler for your application. Measure and analyze the properties of your laser beam, including beam shape, power, divergence, M², and more. Choose from a range of beam characterization instruments, including camera-based, scanning-slit, and knife-edge profilers. Compare and select from leading manufacturers and suppliers on FindLight. Whether you need to optimize laser processing, ensure beam quality, or simply better understand your laser beam, we have the right solution for you. Start your search today and contact suppliers directly for a quote.

Did You know?

Did you know that laser beam characterization is essential to ensure that your laser system is performing at its best? By measuring the beam's characteristics such as beam size, shape, divergence, and polarization, you can optimize your laser system's performance, ensure consistent results, and prevent any potential damage to your system. Laser beam profiling systems offer a variety of measurement techniques, including scanning slit, knife-edge, and Shack-Hartmann wavefront sensors, each with their unique advantages and disadvantages. In addition, beam profiling systems can provide information on laser power, pulse energy, and beam position. With proper beam characterization, you can achieve the desired beam quality, reduce process variability, and improve production efficiency. Find the best beam profiling solutions for your application on FindLight and get in touch with suppliers directly to request quotes and learn more about their products.