Scanning Slit Beam Profilers (Detector Type: Si+InGaAs)

BeamMap2-CM Collimate – Multi-Plane Scanning Slit Beam Profiler

DataRay Inc.

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DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam'R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to ...

Specifications
Detector Type:	Si, InGaAs, Si+InGaAs, Other
Wavelength Range:	190 – 2500 nm
Beam Waist Diameter Measurement:	Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other
M^2 Measurement Capability:	Yes
Minimum PC Requirements:	Windows, 2 GB RAM, USB 2.0/3.0 port

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BeamMap2 – XYZΘΦ Scanning Slit Beam Profiler

DataRay Inc.

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Specifications
Detector Type:	Si, InGaAs, Si+InGaAs, Other
Wavelength Range:	190 – 2500 nm
Beam Waist Diameter Measurement:	Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width, Other
M^2 Measurement Capability:	Yes
Maximum Power & Irradiance:	1 W Total & 0.5 mW/µm²

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On FindLight marketplace you will find 2 different Scanning Slit Beam Profilers (Detector Type: Si+InGaAs) from top global suppliers. Compare features, request pricing, and connect instantly with manufacturers — no registration required.

Beam Characterization

Scanning Slit Beam Profilers (Detector Type: Si+InGaAs)

Specifications

Specifications