Line Laser Profiling System (LLPS)

Specifications

Sensor Type: CMOS
Measurable Sources: CW, Pulsed
Wavelength Range: 190 – 1150 nm
# Pixels (Width): 2048
# Pixels (Height): 2048
Pixel Size (Width): 5.5 um
Pixel Size (Height): 5.5 um
Max Full Frame Rate: 12 Hz
ADC: 12-bit
Stage Length: 50, 200, 500, and 1000 mm
Part Numbers: LLPS-50-LCM, LLPS-200-LCM, LLPS-500-LCM, LLPS-1000-LCM
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Features

  • Line laser length/width measurements
  • Absolute vertical centroids
  • Deviation of vertical centroids from a linear regression line
  • Line tilt measured in degrees
  • 50mm or 200 mm Translation Stage
  • 190 to 1150 nm, CMOS detector o 4.2 MPixel, 2048 x 2048 pixels o 11.3 x 11.3 mm active area o 5.5 µm pixel size
  • HyperCal™ – Dynamic Noise and Baseline Correction software
  • 2,500:1 Signal to RMS Noise
  • 12-bit ADC
  • Window-free sensors standard to prevent fringing
  • Global shutter allowing for pulsed or CW measurements

Applications

  • Calibration
  • Machine vision
  • 3D Scanning
  • Particle Counting
  • Survey Instruments
  • Bar code scanning
  • Laser optics
  • Metrology
  • Rapid prototyping