Incoherent Light Sources
Charged Particle Sources
Optics Manufacturing
Optical Systems
Opto-Mechanics
Engineering Services
Spectral Analysis
Imaging and Vision
Metrology and Inspection
- Home
- Light Analysis
- Beam Characterization
- Beam Profilers
- BEAMAGE-M2 Automated Measurement System
BEAMAGE-M2 Automated Measurement System
SPECIFICATION
- Sensor Type: CMOS
- Measurable Sources: CW, Pulsed
- Wavelength Range: 350 - 1100 nm
- # Pixels (Width): -
- # Pixels (Height): -
- Pixel Size (Width): - um
- Pixel Size (Height): - um
- Max Full Frame Rate: -- Hz
- ADC: 8-bit, 10-bit, 12-bit
Applications
Lase beam measurement and characterization
KEY FEATURES
LARGE APERTURES
SIMPLE ALIGNMENT
COMPACT
ISO COMPLIANT
FAST ACQUISITION
FLEXIBLE & INTUITIVE SOFTWARE
You may also like
-
CCD Beam Profiler UV Monitor 10Hanamura Optics Corp
-
CCD Beam Profiler UV Monitor K2Hanamura Optics Corp
-
CCD Beam Profiler UV MonitorHanamura Optics Corp
-
Beam Profiling And Beam Imaging For X-Ray 1-200 NmStar Tech Instruments
-
Laser Propagation Monitor LPM200Metrolux GmbH
-
Focus Monitor FM100Metrolux GmbH
-
Beam Monitor BM8304Metrolux GmbH
-
XRV-2000 Falcon Camera PhantomLogos Systems
-
XRV-124 Detector PhantomLogos Systems
-
XRV-100 Digital Camera PhantomLogos Systems
-
LPM200 – Laser Propagation Monitor 200Metrolux GmbH
-
FM100 – Focus Monitor 100Metrolux GmbH
Sign in
OR
Don’t have an account?
Please consider registering
NOTE: It may take up to 10 min to receive the registration verification link. For immediate assistance please use the “GUEST” option above.