Description
The SilverBullet (SB) Series spectrometer features a compact concave mirror optical design with a high-speed 1024-pixel CMOS sensor. Powered via USB and available with either 8-bit or 32-bit microcontrollers, it offers fast readout, low power consumption, and accurate triggering. The SB Series includes external I/O connectivity and is compatible with OtO’s SpectraSmart software and SDK.
SilverBullet Compact OEM UV-VIS Series Spectrometer
Evolve Sensing
Specifications
| Wavelength Range (reflectance): | 180 – 1100 nm |
|---|---|
| Resolution: | 3–15 nm (depends on slit & grating) |
| Dimensions: | 40 × 36.3 × 25.1 mm (SB2134) / 49 × 48 × 28.5 mm (SB3130) |
| Detector Type: | 1024-pixel CMOS |
| Cooling: | Passive (no active TEC) |
| Signal-To-Noise Ratio (SNR): | 350 |
| Thermal Stability: | <0.04 nm / °C |
| A/D Resolution: | 16-bit |
| Integration / Scan Time Range: | 6 µs – 65 s |
| Minimum Scan Time: | 0.000006 s |
| Dynamic Range: | 5200 |
| Optical Resolution (FWHM): | 3–15 nm |
| Stray Light: | < 0.04–0.2 % |
| Interfaces: | USB 2.0, 8-pin I/O (6 GPIO + trigger + lamp) |
| Connector Type: | SMA905 fiber |
| Power Requirements: | +5 V DC @ 500 mA (USB) |
| Operating Temperature: | 0 °C – 50 °C |
| Storage Temperature: | –30 °C – 70 °C |
| Environmental Limits: | 0–90 % RH non-condensing |
| A/D Converter Type: | 16-bit ADC |
Features
- High speed 1024-pixel CMOS sensor
- Customizable modular components (grating, slit)
- Integration time: 6 μs–65 s
- 16-bit, 15 MHz A/D converter
- Micro USB, 8-pin external I/O port (6 digital I/O)
- Plug-n-play software, SDK available
- Flash ROM storage (wavelength, linearity, intensity calibration)
- Integration clock rate details:
- 6 μs–65 s (10 MHz)
- 21 μs–65 s (5 MHz)
- Trigger modes: single, software, multiple capture
- GPIO functionality: six configurable 3.3 V pins for OEM applications
Applications
- UV–Vis–NIR spectroscopy and optical analysis
- High-speed process and quality control monitoring
- Portable and handheld analytical instruments
- LED, laser, and light source characterization
- Thin-film and color measurement
- Material identification and reflectance analysis
- Environmental and agricultural sensing
- Scientific and industrial R&D
- OEM and embedded system integration
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