Delta OCT Series Spectrometer

Evolve Sensing

Specifications

Resolution: 0.04 nm
Wavelength Range (Reflectance): 800–880 nm
Dimensions: 180 × 120 × 63 mm (spectrometer only); 60 × 60 × 31.1 mm (camera)
Detector Type: 2048-pixel CMOS line-scan sensor
Cooling: Uncooled (ambient operation, 5–40 °C)
Signal-To-Noise Ratio (SNR): 51 dB (single acquisition)
Thermal Stability: Factory-calibrated alignment repeatability ensured by patented mechanism
A/D Resolution: 10 / 11 / 12-bit selectable
Integration / Scan Time Range: 12.5 µs – 50 µs (model dependent)
Minimum Scan Time: 0.0000125 s
Average Minimum Scan Time: 0.00003125 s
Dynamic Range: 69 dB
Optical Resolution (FWHM): 0.04 – 0.07 nm
Stray Light: < 0.2 % (design-optimized)
Interfaces: USB 3.0 high-speed data interface
Connector Type: 5 µm single-mode FC/PC fiber input
Power Requirements: 6–15 V DC (< 3.6 W, USB 3.0 compliant)
Operating Temperature: 5 °C – 40 °C
Storage Temperature: –30 °C – 70 °C
Environmental Limits: 0 – 85 % RH, non-condensing
A/D Converter Type: 10 / 11 / 12-bit selectable ADC
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Features

  • Ultra-high optical resolution: 0.04 nm
  • Transmission grating and fully transmissive Czerny–Turner (T–T–T) design
  • f/# 3.6, NA 0.14; focal length 60–89 mm @ 840 nm
  • Wavelength range: 800–880 nm
  • Available with 20 kHz or 80 kHz CMOS line-scan cameras
  • High sensitivity and low dispersion for OCT performance
  • 5 µm single-mode FC/PC fiber input
  • USB 3.0 high-speed data interface
  • Supports wavelength calibration and SDK-based software integration
  • Designed for ophthalmic and tissue OCT systems

Applications

  • Optical coherence tomography (OCT) for ophthalmic and dermatologic imaging
  • Semiconductor wafer and surface inspection
  • Biomedical and tissue diagnostics
  • High-resolution NIR spectroscopy and precision optical analysis
  • Industrial metrology and non-destructive testing
  • Material identification and quality control
  • Scientific and OEM system integration