Phenom Vis-NIR High Resolution Series Spectrometer

Evolve Sensing

Specifications

Resolution: 0.1 nm
Wavelength Range (Reflectance): 400–1000 nm (VIS models) / 900–1700 nm (NIR models)
Dimensions: 180 × 175 × 60.7 mm
Detector Type: CCD (2048 px, PN1050) / CMOS (4096 px, PN1080, PN2080) / InGaAs (512 px, PN2570)
Cooling: Uncooled (ambient operation, 0–50 °C)
Signal-To-Noise Ratio (SNR): > 300:1 (single scan @ 10 ms); up to 1500:1 (averaged)
Thermal Stability: < 0.01 nm / °C
A/D Resolution: 16-bit
Integration / Scan Time Range: 0.1 ms – 65 s (model dependent)
Minimum Scan Time: 0.0001 s
Average Minimum Scan Time: 0.0001 s
Dynamic Range: Up to 4000 : 1
Optical Resolution (FWHM): < 0.1 nm (VIS) / < 0.25 nm (NIR) @ 10 µm slit
Stray Light: < 0.1 % (typical)
Interfaces: USB 2.0 high-speed data interface
Connector Type: SMA905 / FC-PC fiber input
Power Requirements: +5 V DC ± 5%, 300 mA (USB powered)
Operating Temperature: 0 °C – 50 °C
Storage Temperature: –30 °C – 70 °C
Environmental Limits: 0 – 90 % RH, non-condensing
A/D Converter Type: 16-bit ADC
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Features

  • T–R–T Czerny–Turner optical design with 2nd and 3rd order rejection
  • Choice of CCD, CMOS, or InGaAs sensors
  • High dynamic range and low noise performance
  • Integration time: 0.1 ms to 65 s (model dependent)
  • USB 2.0 interface (480 Mbps) with plug-and-play SpectraSmart software
  • Modular configuration for grating, slit, and sensor customization
  • Onboard Flash ROM storage for wavelength, linearity, and intensity correction
  • Supports up to 4,000 spectra buffering in ring-buffer mode
  • External 8-pin I/O port for GPIO, UART, trigger, and light-source control
  • Compact, vibration-resistant design for stable measurement under thermal drift

Applications

  • Optical coherence tomography (OCT) and biomedical imaging
  • Semiconductor and surface inspection
  • UV–NIR spectroscopy and precision optical analysis
  • Raman and fluorescence spectroscopy
  • Thin-film and ellipsometry measurement
  • LED, laser, and light source characterization
  • Scientific and industrial sensing
  • Process and quality control monitoring
  • Environmental and agricultural analysis
  • OEM and embedded system integration