RIKI optical platform

RudeerTEK

Specifications

Wavelength Range (reflectance): 400 – 800 nm
Resolution: 2.5 nm
Minimum Scan Time: Not Specified
Weight: 350 g
Dimenions: 112 mm x 60 mm x 41 mm
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Features

  • Transmitted optical path
  • Strong scalability
  • Low stray light
  • High sensitivity
  • Comprehensive technical support

Applications

  • Environmental monitoring
  • Online sorting
  • Color measurement
  • Contour detection
  • Semiconductor industry