RIKI optical platform

RudeerTEK

Specifications

Wavelength Range (reflectance): 400 – 800 nm
Resolution: 2.5 nm
Minimum Scan Time: Not Specified
Weight: 350 g
Dimenions: 112 mm x 60 mm x 41 mm
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Features


  • Transmitted optical path

  • Strong scalability

  • Low stray light

  • High sensitivity

  • Comprehensive technical support

Applications


  • Environmental monitoring

  • Online sorting

  • Color measurement

  • Contour detection

  • Semiconductor industry