NEVE optical platform

RudeerTEK

Specifications

Wavelength Range (reflectance): 200 – 1100 nm
Resolution: 1 nm
Minimum Scan Time: Not Specified
Weight: 400 g
Dimensions: 120 mm x 98 mm x 26 mm
Document icon Download Data Sheet Download icon

Features


  • Long focal length optical path

  • Strong scalability

  • Low stray light

  • Flexible configuration

  • Comprehensive technical support

Applications


  • Environmental monitoring

  • Online sorting

  • Raman spectroscopic detection

  • Fluorescence detection

  • Semiconductor industry