NEVE optical platform

RudeerTEK

Specifications

Wavelength Range (reflectance): 200 – 1100 nm
Resolution: 1 nm
Minimum Scan Time: Not Specified
Weight: 400 g
Dimensions: 120 mm x 98 mm x 26 mm
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Features

  • Long focal length optical path
  • Strong scalability
  • Low stray light
  • Flexible configuration
  • Comprehensive technical support

Applications

  • Environmental monitoring
  • Online sorting
  • Raman spectroscopic detection
  • Fluorescence detection
  • Semiconductor industry