Name: ET-100 Emissometer
Brand: Surface Optics Corp
Availability: InStock

Description

The ET-100 Emissometer is a cutting-edge instrument designed to measure directional reflectance across a wide spectral range of 1.5 to 21 μm. By analyzing these reflectance values, the ET-100 calculates both directional and total hemispherical emissivity, providing critical data for a variety of scientific and industrial applications. This device is engineered to conform to ASTM E408, the standard test method for determining emittance using portable instruments, ensuring reliable and standardized results.

Designed with versatility in mind, the ET-100 offers in-band reflectance data for six discrete bands, making it suitable for a wide array of materials and conditions. Its immediate warm-up feature eliminates the need for equilibration time between measurements, allowing for rapid and efficient data collection. The ET-100 is capable of providing data at two incident angles, 20° and 60°, enhancing its applicability for different measurement scenarios.

With its built-in touchscreen display and intuitive operating software, the ET-100 facilitates easy calibration, measurement setup, and data management, whether in the field or in the laboratory. The device's portable command module configuration and desktop remote control unit (RCU) configuration offer flexibility and convenience for users. Additionally, the ET-100 serves as a reliable replacement for the discontinued Gier Dunkle DB-100, maintaining continuity for users familiar with that model.

It's important to note that the ET-100 is subject to US export regulations and may require a license prior to export. Surface Optics Corp. ensures compliance with these regulations, prohibiting diversion contrary to US law. This commitment to legal and ethical standards underscores the company's dedication to providing high-quality, compliant products to its global customer base.

Specifications

Wavelength Range (reflectance):	1500 – 21000 nm
Minimum Scan Time:	7 sec
Measured Parameter:	Directional hemispherical reflectance (DHR)
Measured Value:	Absolute reflectance (0-1)
Calculated Value:	Directional thermal emissivity at 20º, directional thermal emissivity at 60º, hemispherical thermal emissivity
Wavelength Bands:	1.5-2.0, 2.0-3.5, 3.0-4.0, 4.0-5.0, 5.0-10.5, 10.5-21 µm
Angle Of Incidence:	20º & 60º from normal incidence
ASTM Standards:	E903
Calibration Coupon:	Specular Gold
Accuracy:	+/- .03
Repeatability:	±.005 units
Beam Spot Size:	0.50 inches
Measurement Time:	10 sec
Sample Size & Geometry:	Flat: ≥ 0.5 in. diameter, Curved: 6 in. convex; 12 in. concave
Warm Up Time:	90 seconds
Time Between Measurements:	2 seconds
Sample Temperature:	Ambient or heated/cooled to 0 - 100º C
Operating Temp:	0º to 40º C
Run Time:	2 hours on one battery

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Features

Directional Reflectance Measurement: Measures directional reflectance from 1.5 to 21 μm and calculates directional and total hemispherical emissivity.
ASTM Compliant: Conforms to ASTM E408 and E1980 standards for emittance determination using a portable instrument.
Six Discrete Bands: Provides in-band reflectance data for six discrete bands: 1.5–2.0, 2.0–3.5, 3.0–4.0, 4.0–5.0, 5.0–10.5, and 10.5–21 µm.
Immediate Warm-up: No equilibration time needed between measurements, allowing for quick data collection.
Dual Incident Angles: Offers measurements at 20° and 60° angles of incidence for comprehensive data.
Material Versatility: Accurately measures emittance for both metals and dielectrics.
Elevated Temperature Model: Predicts emittance from room temperature samples, enhancing versatility.
In-band Spectral Resolution: Provides greater accuracy for selectively radiating materials.
Replacement for Gier Dunkle DB-100: Serves as a reliable replacement for the discontinued DB-100 model.
Portable Command Module Configuration: Features a built-in touchscreen display and intuitive operating software for easy calibration, measurement setup, data review, and management in the field or lab.
Desktop Remote Control Unit (RCU) Configuration: Offers flexibility in operation and control.
Measured Data: Provides directional hemispherical reflectance (DHR) and calculates directional thermal emissivity at 20º and 60º, as well as hemispherical thermal emissivity.
Performance: Accuracy of +/- .03 with repeatability of ±.005 units, a beam spot size of 0.50 inches, and a measurement time of 10 seconds.
Sample Compatibility: Suitable for flat samples with a diameter of ≥ 0.5 inches and curved samples with a 6-inch convex or 12-inch concave geometry.

Applications

Space Coatings Thermal Control: Optimize materials for spacecraft thermal management.
Defense & Aerospace: Essential for IR signature reduction and heat transfer studies.
Semiconductor Industry: Analyze wafer emissivity and fabrication processes.
Solar & Energy Research: Supports concentrated solar energy and SRI studies.
Thermal Modeling & Simulation: Provides accurate emissivity input for computational models.
Cool Building Analysis: Evaluate reflective materials for energy-efficient construction.