Carrier.OBHL100.C Scanning Motion Vertical Piezoelectric Stage

Specifications

Load Capacity: 0.5 kg
Vacuum Compatible: Yes
Microstep Size (default Resolution): 0.0001 um
Built-in Controller: Yes
Travel Range: 0.1 mm
Accuracy (unidirectional): 0.001 um
Backlash: ≤5 um
Loaded Backlash (10 N): Not Specified
Maximum Speed: 10 mm/s
Weight: 0.5 kg
Guiding Mechanism: Other
Voltage Requirement: Other
Resolution (close Loop): 0.3 nm
Resolution (open Loop): 0.1 nm
8 Resonance Frequency (unloaded): 900 Hz
Resonance Frequency (150 G-loaded): 500 Hz
Direction Of Motion: Z-axis
Closed-Loop Resolution: 0.3 nm
Open-Loop Resolution: 0.1 nm
Settling Time (90%): 10 ms
Main Body Material: Stainless Steel 304, Aluminum Alloy
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Features


  • 100 µm Z-Axis Travel Range: Extended vertical motion for detailed scanning

  • Ultra-Fast Response: 10 ms (90%) settling time for real-time positioning

  • High Resolution: Closed-loop resolution as low as 0.3 nm for precise control

  • Capacitive Sensor Feedback: Ensures ultra-stable motion and linearity

  • Versatile Environment Support: Available ,. HV, and. UHV configurations

  • High Load Capacity: Supports up to 500 g, ideal for heavy objectives or setups

  • Rugged Build: Constructed with stainless steel and aluminum alloy for durability

Applications


  • Semiconductor Characterization: Precision alignment and scanning for wafer inspection

  • Automated Optical Systems: Auto-focus platforms in research and industry

  • High-Resolution Imaging: Enhances clarity and depth in advanced microscopy

  • Laser Processing & Measurement: Stable motion for micro-machining and diagnostics

  • Vacuum-Based Research: Suitable for UHV/cleanroom applications in nanotech and photonics