Carrier.OB050.C Scanning Motion Vertical Piezoelectric Stage
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Ships from:
China
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Sold by:
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On FindLight:
since 2020
Description
The Carrier.OB050.C objective scanner from MultiFields is a high-precision Z-axis piezo stage engineered for demanding microscopy and autofocusing applications. With a travel range of 50 µm and a closed-loop resolution of less than 1 nm, this stage delivers ultra-fine positioning accuracy, making it ideal for high-resolution imaging systems. The stage features a fast 10 ms settling time (90%) and a capacitive sensor for exceptional linearity and stability (linearity error < 0.02%).
Constructed with stainless steel and aluminum alloy for durability and stability, the Carrier.OB050.C supports payloads up to 500 g while maintaining performance with a resonance frequency of 600 Hz (unloaded) and 300 Hz (with 150 g load). It integrates seamlessly with the MC-Archimedes Series motion controller for precise and responsive motion control.
The Carrier.OB050.C is also available in optional versions tailored for non-magnetic (.NM), high vacuum (.HV), and ultra-high vacuum (.UHV) environments, offering maximum versatility for advanced scientific and industrial settings. Whether for laser scanning microscopy, semiconductor metrology, or automated focus control, this compact and powerful piezo scanner sets a new standard in Z-axis motion.
Carrier.OB050.C Scanning Motion Vertical Piezoelectric Stage
Specifications |
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Load Capacity: | 0.5 kg |
Vacuum Compatible: | Yes |
Microstep Size (default Resolution): | 0.001 um |
Built-in Controller: | |
Travel Range: | 0.05 mm |
Accuracy (unidirectional): | 0.001 um |
Backlash: | ≤ 10 um |
Loaded Backlash (10 N): | <10 um |
Maximum Speed: | Not Specified |
Weight: | Not Specified |
Guiding Mechanism: | Other |
Voltage Requirement: | Other |
Resonance Frequency: | 600 Hz |
Resonance Frequency: | 300 Hz |
Resolution (close Loop): | 1 nm |
Resolution (open Loop): | 0.2 nm |
Compatible Controller: | MC-Archimedes Series |
Main Body Materials: | Stainless Steel 304, Aluminum Alloy |
Direction Of Movement: | Z-axis |
Features
- Compact Z-Axis Travel: Offers 50 µm vertical motion ideal for precision scanning and focus
- Closed-Loop Resolution < 1 nm: Achieves ultra-fine positioning accuracy using capacitive sensing
- High Load Capacity: Supports up to 500 g without compromising performance
- Fast Response: 10 ms settling time ensures rapid positioning with high repeatability
- Robust Construction: Made from stainless steel and aluminum alloy for durability and stability
- Environmental Versatility: Optional models for non-magnetic, high vacuum, and ultra-high vacuum use
- High Resonance Frequency: 600 Hz unloaded, ensuring fast and stable motion
Applications
- Autofocus Systems: Enables rapid and precise focal adjustments in automated imaging
- Confocal and Super-Resolution Microscopy: Supports nanometer-level axial movement for detailed imaging
- Semiconductor Inspection: Delivers stable Z-axis motion for surface profiling and wafer inspection
- Optical Metrology: Ideal for high-precision measurement tasks requiring vertical positioning
- Vacuum and Cryogenic Systems: Optional UHV/NM versions suited for extreme environments