Carrier.OB050.C Scanning Motion Vertical Piezoelectric Stage

Specifications

Load Capacity: 0.5 kg
Vacuum Compatible: Yes
Microstep Size (default Resolution): 0.001 um
Built-in Controller: Not Specified
Travel Range: 0.05 mm
Accuracy (unidirectional): 0.001 um
Backlash: ≤ 10 um
Loaded Backlash (10 N): <10 um
Maximum Speed: Not Specified
Weight: Not Specified
Guiding Mechanism: Other
Voltage Requirement: Other
Resonance Frequency: 600 Hz
Resonance Frequency: 300 Hz
Resolution (close Loop): 1 nm
Resolution (open Loop): 0.2 nm
Compatible Controller: MC-Archimedes Series
Main Body Materials: Stainless Steel 304, Aluminum Alloy
Direction Of Movement: Z-axis
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Features


  • Compact Z-Axis Travel: Offers 50 µm vertical motion ideal for precision scanning and focus

  • Closed-Loop Resolution < 1 nm: Achieves ultra-fine positioning accuracy using capacitive sensing

  • High Load Capacity: Supports up to 500 g without compromising performance

  • Fast Response: 10 ms settling time ensures rapid positioning with high repeatability

  • Robust Construction: Made from stainless steel and aluminum alloy for durability and stability

  • Environmental Versatility: Optional models for non-magnetic, high vacuum, and ultra-high vacuum use

  • High Resonance Frequency: 600 Hz unloaded, ensuring fast and stable motion

Applications


  • Autofocus Systems: Enables rapid and precise focal adjustments in automated imaging

  • Confocal and Super-Resolution Microscopy: Supports nanometer-level axial movement for detailed imaging

  • Semiconductor Inspection: Delivers stable Z-axis motion for surface profiling and wafer inspection

  • Optical Metrology: Ideal for high-precision measurement tasks requiring vertical positioning

  • Vacuum and Cryogenic Systems: Optional UHV/NM versions suited for extreme environments