Room Temperature Carrier.S100-OB. Z Objective Autofocus Scanning Table

Specifications

Load Capacity: 0.5 kg
Vacuum Compatible: Yes
Microstep Size (default Resolution): 0.0001 um
Built-in Controller: No
Travel Range: 0.1 mm
Accuracy (unidirectional): 0.0003 um
Backlash: ≤5 um
Loaded Backlash (10 N): Not Specified
Maximum Speed: Not Specified
Weight: 0.27 kg
Guiding Mechanism: Other
Voltage Requirement: DC 24V
Pitch / Yaw: 30 urad
Position Encoder: Resistive Sensor
Sensor Noise: 0.3 nm
Z-axis Resolution (Open-loop): 0.1 nm
Stabilize Time (90% Position): 15 ms
Rigidity: 0.4 N/um
Resonant Frequency (No Load): 650 Hz
Weight: 270 g
Main Body: Stainless Steel 304, Aluminum Alloy
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Features


  • 100 µm Z-Axis Travel Range: Enables high-precision vertical motion for objective scanning tasks

  • Sub-Nanometer Closed-Loop Resolution: Delivers ultra-fine positioning with better than 1 nm accuracy using resistive feedback sensors

  • Fast Stabilization: Achieves 90% position stability within just 15 milliseconds, ensuring rapid response in dynamic systems

  • Compact & Rigid Design: High structural rigidity of 0.4 N/µm in a compact footprint supports stability and precision

  • High Load Capacity: Capable of supporting up to 500 g for compatibility with a wide range of optical or mechanical payloads

  • Ultra-Low Sensor Noise: Provides reliable feedback with only 0.3 nm of sensor noise

  • Vacuum & Magnetic Compatibility: Available in non-magnetic (.NM) and ultra-high vacuum (.UHV) configurations for specialized environments

  • Controller Integration: Seamlessly interfaces with MultiFields® Archimedes Series motion controllers for optimized system control

Applications


  • Objective Autofocus Scanning: Ideal for high-resolution microscopy systems requiring accurate and fast Z adjustments

  • Precision Optics Alignment: Supports sub-micron alignment for lens systems, photonic devices, and metrology setups

  • Semiconductor Inspection: Ensures precise height control in wafer mapping, defect inspection, and surface profiling

  • Nano-Positioning Research: Suitable for nanotech and material science experiments demanding tight spatial control

  • Vacuum-Compatible Systems: Designed for use in cleanroom and vacuum environments, including high and ultra-high vacuum setups

  • High-Speed Optical Testing: Supports rapid Z-axis scanning for dynamic photonic and MEMS device evaluations