LS65z.Lab .O/.R .NM 65mm Series Vertical Motion Stage (totally non-magnetic version supplied)

Specifications

Load Capacity: 0.5 kg
Vacuum Compatible: Yes
Microstep Size (default Resolution): 0.5 um
Built-in Controller: No
Travel Range: 10 mm
Accuracy (unidirectional): 30 um
Backlash: Not Specified
Loaded Backlash (10 N): Not Specified
Maximum Speed: 10 mm/s
Weight: 0.5 kg
Guiding Mechanism: Other
Voltage Requirement: Other
Drive Frequency: Max. 20 kHz (very quiet)
Pitch: 0.3 mard
Sensor Type: Resistive Sensor (.R) / Optical Encoder (.O)
Connector Type: Standard shielded cable, circular & D-Sub15
Cable Material: Kapton-shielded wire, 2 mm PEEK pins
Operating Temperature Range: +15 to +41 °C
Mount Compatibility: Compatible with 65 mm series & multi-axis stacking adapters
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Features


  • Compact Design: Measures only 65 mm × 65 mm × 42.5 mm, ideal for tight lab environments

  • Extended Travel Range: Offers precise vertical motion up to 10 mm

  • Ultra-Fine Resolution: Achieves ~10 nm step size for nano-level positioning accuracy

  • Quiet Operation: Driven at a high-frequency of 20 kHz, ensuring minimal acoustic noise

  • Closed-Loop Control: Equipped with resistive (.R) or optical (.O) sensors for feedback precision

  • Flexible Sensor Options: Choose from economical resistive sensors (100–200 nm) or high-resolution optical encoders (down to 1 nm)

  • High Load Capacity: Supports payloads up to 500 g while maintaining stability

  • Precision Pitch/Yaw Control: Maintains angular errors within 0.3 mrad for superior alignment

  • Vacuum Compatibility: Available in non-magnetic, high vacuum, and ultra-high vacuum variants

  • Seamless Integration: Compatible with multi-axis systems and MC-Newton.Pro controllers

Applications


  • Super-Resolution Microscopy: Delivers accurate vertical focusing for high-resolution imaging

  • Optics and Photonics Alignment: Provides stable z-axis motion for precise beam alignment

  • Vacuum Chamber Positioning: Ideal for sample movement in HV/UHV environments
    Nanopositioning Systems: Integrates into stacked or modular platforms for 3D control

  • Materials Testing and Metrology: Enables controlled vertical displacement for precision experiments