Description
SID4 UHR Ultra High Resolution Wavefront Sensor for Optical Metrology
The SID4 UHR Ultra High Resolution wavefront sensor is designed for demanding optics metrology applications where dense spatial sampling, precise phase measurement, and a large analysis aperture are required. Developed for live wavefront measurement across complete optical samples, this compact instrument supports advanced characterization of lenses, objectives, aspherical optics, freeform components, optical surfaces, and laser beams. Its ultra-high-resolution phase mapping makes it especially suitable for laboratories and production environments that require accurate inspection of complex optical elements.
Unlike conventional wavefront sensing approaches that may require a compromise between field coverage, sampling density, and implementation complexity, the SID4 UHR combines high-resolution measurement capability with straightforward integration. With phase and intensity sampling of 554 x 554 points and an optional 666 x 666 configuration, it provides a highly detailed wavefront map for identifying subtle optical defects, high spatial frequency errors, surface irregularities, roughness signatures, and localized aberrations. This makes it a strong choice for optical component validation, precision alignment, quality control, and research-grade metrology workflows.
The sensor operates across a broad 400 to 1100 nm wavelength range, making it compatible with many visible and near-infrared optical systems. Its 15.29 x 15.29 mm² aperture enables direct measurement over relatively large samples or expanded laser beams, reducing the need for additional relay optics in many setups. A spatial resolution of approximately 27.6 µm supports fine-scale analysis, while the phase resolution of less than 5 nm RMS provides the sensitivity needed for high-precision wavefront metrology and surface inspection.
For laser characterization, the SID4 UHR delivers precise phase and intensity information that can be used to evaluate beam quality, wavefront distortions, optical alignment, collimation, and system aberrations. Its high-performance camera and optimized signal-to-noise performance support reliable analysis in research, development, and industrial test benches. The ability to capture instantaneous measurements over a large field is valuable for fast setup verification and repeatable optical testing.
The SID4 UHR is also well suited for the characterization of advanced optical components, including microscope objectives, imaging lenses, molded optics, precision polished elements, aspheres, and freeform surfaces. In surface inspection applications, it helps detect roughness, polishing defects, high-frequency deformation, and other surface-related issues that can affect optical performance. Its combination of compact size, USB 3.1 interface, and real-time processing capability allows it to be integrated into metrology stations, automated inspection systems, optical benches, and manufacturing quality-control platforms.
With dimensions of approximately 73 x 70.5 x 93.2 mm and a weight of about 475 g, the SID4 UHR offers high-end wavefront measurement performance in a compact footprint. For users searching for an ultra-high-resolution wavefront sensor, optical metrology sensor, laser wavefront analyzer, surface inspection instrument, or high-density phase measurement device, the SID4 UHR provides a precise and versatile solution for both research and industrial optics applications.
Phasics SID4 UHR Ultra High Resolution Wavefront Sensor 400-1100nm
Specifications
| Wavelength Range: | 400 – 1100 nm |
|---|---|
| # Pixels (Width): | 554 |
| # Pixels (Height): | 554 |
| Lenslet Pitch: | 27.6 um |
| Wavefront Accuracy: | <= lambda/30 |
| Type: | Lateral Shearing |
| Aperture Dimension: | 15.29 x 15.29 mm² |
| Spatial Resolution: | 27.6 µm |
| Phase And Intensity Sampling: | 554 x 554 |
| Phase Resolution: | < 5 nm RMS |
| Frame Rate: | 8 fps |
| Real-time Processing Frequency: | 1 Hz at full resolution |
| Interface: | USB 3.1 |
| Dimensions (W X H X L): | 73 x 70.5 x 93.2 mm |
| Weight: | ~475 g |
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Features
- Ultra-High Resolution Wavefront Measurement: The SID4 UHR Ultra High Resolution Wavefront Sensor delivers dense phase and intensity sampling of 554 x 554 points, with an optional 666 x 666 sampling configuration, making it ideal for advanced optics metrology, laser beam analysis, and precision optical component characterization.
- Large Analysis Aperture for Full-Sample Inspection: Featuring a large15.29 x 15.29 mm² aperture, the SID4 UHR enables live wavefront measurement over complete optical samples, reducing the need for scanning and improving measurement efficiency.
- High Spatial Resolution: With a fine 27.6 µm spatial resolution, this wavefront sensor is optimized for detecting high-frequency defects, surface roughness, local slope errors, and small-scale wavefront variations in demanding optical metrology applications.
- Exceptional Phase Sensitivity: The sensor provides a phase resolution of < 5 nm RMS, enabling highly precise measurement of optical aberrations, transmitted wavefront error, reflected wavefront error, and laser beam quality.
- Broad Wavelength Compatibility: Operating across a wide 400 nm to 1100 nm wavelength range, the SID4 UHR supports visible to near-infrared applications, including laser characterization, optical testing, and research-grade wavefront analysis.
- Optimized for Optics Metrology: Designed specifically for optical testing needs, the SID4 UHR is suitable for characterizinglenses, microscope objectives, aspherical optics, freeform optics, mirrors, windows, and precision optical assemblies.
- Advanced Surface Inspection Capability: Ideal for surface quality control, this high-resolution wavefront sensor supports the inspection of roughness, high-frequency defects, polishing errors, surface deformation, and manufacturing imperfections.
- Large Field Instantaneous Measurement: The SID4 UHR provides instantaneous wavefront acquisition over a wide field, enabling fast and repeatable measurements for laboratory, production, and industrial quality control environments.
- High Dynamic Range Performance: Engineered for accurate measurement across challenging optical conditions, the sensor combines high sampling density with a broad dynamic range for reliable analysis of complex wavefronts and optical surfaces.
- Optimized Signal-to-Noise Ratio: Built with a high-performance camera, the SID4 UHR delivers excellent signal quality for low-noise phase measurements, supporting precise laser beam characterization and optical component testing.
- Real-Time Wavefront Analysis: The system supports an 8 fps frame rate and 1 Hz real-time processing at full resolution when used with the PHASICS computer and PhaseStudio software, enabling efficient live monitoring and alignment.
- Compact and Easy to Integrate: With compact dimensions of73 x 70.5 x 93.2 mm and a weight of approximately 475 g, the SID4 UHR is easy to install on optical benches, metrology stations, R&D setups, and industrial inspection systems.
- USB 3.1 Interface: The integratedUSB 3.1 connection ensures fast data transfer and convenient connectivity for modern laboratory and industrial measurement platforms.
- Research and Industrial Grade Solution: Combining compact design, high aperture, ultra-high sampling, and nanometer-level phase precision, the SID4 UHR is well suited for both scientific research and industrial optical quality control.
- Ideal Applications: Common use cases include large aperture laser characterization, optical component characterization, wavefront metrology, surface inspection, lens testing, objective testing, asphere measurement, freeform optics inspection, and high-resolution beam diagnostics.
- Powered by PHASICS SID4 Technology: The SID4 UHR combines the ease of implementation associated with PHASICS SID4 wavefront sensors with increased resolution and sampling density for demanding ultra-high-resolution metrology tasks.
Applications
Applications of the SID4 UHR Ultra High Resolution Wavefront Sensor
- Ultra high resolution wavefront measurement: The SID4 UHR is ideal for precise wavefront analysis in advanced optical metrology, providing dense phase and intensity sampling for accurate characterization of complex optical systems.
- Optical component characterization: Used to measure and validate the optical quality of lenses, objectives, mirrors, prisms, beam expanders, collimators, and other precision optical components.
- Aspherical and freeform optics metrology: Well suited for testing high-performance aspheric lenses and freeform optical surfaces where high spatial resolution and large aperture analysis are required.
- Surface inspection and defect detection: Enables inspection of polished optical surfaces for roughness, high-frequency defects, surface irregularities, scratches, mid-spatial frequency errors, and manufacturing imperfections.
- Laser beam characterization: Provides accurate measurement of laser wavefront, phase profile, beam quality, intensity distribution, and optical aberrations for visible and near-infrared laser systems from 400 nm to 1100 nm.
- Large aperture laser metrology: The large analysis pupil makes the SID4 UHR suitable for live wavefront measurement over broad laser beam diameters without requiring complex scanning setups.
- Research and development in photonics: Supports laboratories and R&D teams working on advanced photonics, laser systems, optical design validation, and precision wavefront control.
- Quality control in optics manufacturing: Integrates into production and inspection workflows for repeatable testing of optical components, helping manufacturers verify optical performance and detect defects early.
- Microscope objective testing: Used for evaluating microscope objectives, high numerical aperture optics, imaging lenses, and scientific imaging systems by measuring wavefront errors and aberrations.
- Camera lens and imaging system alignment: Helps characterize and optimize imaging systems by measuring aberrations such as defocus, astigmatism, coma, spherical aberration, and higher-order optical errors.
- Adaptive optics development: Suitable for testing adaptive optics systems, deformable mirrors, spatial light modulators, and wavefront correction modules used in imaging, laser delivery, and scientific instrumentation.
- Collimation testing and beam alignment: Allows precise verification of beam collimation, optical alignment, and system aberrations in laser benches, optical assemblies, and laboratory test setups.
- Interferometry alternative for optical testing: Provides a compact and easy-to-implement solution for wavefront and phase measurement where a high-resolution wavefront sensor is preferred over more complex interferometric setups.
- Semiconductor and micro-optics inspection: Applicable for metrology of micro-optical components, wafer-level optics, photonic devices, diffractive optics, and precision optical surfaces used in semiconductor and electronics manufacturing.
- AR/VR and display optics testing: Useful for characterizing lenses, waveguides, near-eye display optics, projection optics, and freeform components used in augmented reality, virtual reality, and head-mounted display systems.
- Aerospace and defense optical metrology: Supports qualification and performance testing of high-precision optical assemblies used in aerospace imaging, targeting systems, remote sensing, and laser-based defense applications.
- Telescope and astronomical optics testing: Can be used for wavefront analysis of telescope optics, mirrors, relay optics, and adaptive optics elements in astronomy and space observation instrumentation.
- High precision optical alignment: Enables real-time feedback during alignment of complex optical systems, reducing setup time and improving final optical performance.
- Lens production validation: Ideal for batch testing and performance verification of precision lenses, including spherical, aspherical, cylindrical, and custom-designed optics.
- Optical system aberration analysis: Measures low-order and high-order aberrations for detailed evaluation of system performance in laboratory, industrial, and production environments.
- Wavefront mapping over large fields: The large aperture and high sampling density allow live wavefront measurement across the complete sample under test, making it effective for large field optical inspection.
Frequently Asked Questions
What is the SID4 UHR Ultra High Resolution wavefront sensor used for?
What wavelength range does the SID4 UHR wavefront sensor support?
What is the spatial resolution and phase map sampling of the SID4 UHR?
How accurate is the SID4 UHR for wavefront and phase measurements?
What aperture size does the SID4 UHR wavefront sensor have?
What is the frame rate and real-time processing speed of the SID4 UHR?
How does the SID4 UHR compare with Shack-Hartmann wavefront sensors?
Got more questions? Use the inquiry form to ask the supplier directly.
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