LIFT 272 Wavefront Sensor

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Specifications

Wavelength Range: 400 – 750 nm
# Pixels (Width): Not Specified
# Pixels (Height): Not Specified
Lenslet Pitch: Not Specified
Wavefront Accuracy: Other
Type: Shack Hartmann, Lateral Shearing, Hartmann, Zernike, Other / Not specified
Repeatability: Lambda/200 RMS
Phase Point Resolution: 272 x 200
Absolute Accuracy: λ/100 RMS
Pupil Size: 7.0 x 5.2 mm²
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Features

The LIFT 272 enables you to perform multiple functions by
combining :



  • Ultra-high spatial resolution of 272 x 200, allowing characterization over several hundreds of Zernike polynomials

  • Accuracy of λ/100 RMS permitting small defects detection

  • Dynamic range superior to 1000 λ for direct wavefront acquisition of converging and diverging beams

Applications

Successfully used in the most demanding of applications in optical metrology, microscopy, and laser diagnostics, The LIFT 272 enables you to :



  • Quantify the optical system’s aberrations

  • Align the system to ensure that it performs at its best

  • Predict the optical system’s performance in terms of focalization capability or imaging quality

  • Quantify the effects of temperature and gravity on the system’s performance

  • Verify that the optics comply with specifications

  • Directly measure the optical system’s wavelength dependency

  • Pilot a wavefront corrector to change the system’s aberrations

  • Check whether the optical mount overly distorts the optics