LIFT 272 Wavefront Sensor
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How to order?
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Ships from:
France
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Sold by:
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On FindLight:
since 2023
Description
The LIFT 272 wavefront sensor is as powerful as its counterpart in terms of accuracy and dynamic range, while offering an unequaled resolution of 272 x 200 phase points. This allows the LIFT 272 to provide high-level of performance for applications requiring high accuracy, high dynamic range and high spatial resolution. It provides high-resolution and broadband for maximum precision and versability. The second generation was released in 2020, and features the new SpotTracker technology.
It provides absolute wavefront and tilt information, eliminating alignment requirements.
BEST FOR VERSATILITY
- A great choice for lab or industrial application
- Successfully used in the most demanding of applications in optical metrology, microscopy and laser diagnostics.
- Optimize the alignment of complex systems
- On and off-axis 3D MTF
LIFT 272 Wavefront Sensor
Specifications |
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|---|---|
| Wavelength Range: | 400 – 750 nm |
| # Pixels (Width): | Not Specified |
| # Pixels (Height): | Not Specified |
| Lenslet Pitch: | Not Specified |
| Wavefront Accuracy: | Other |
| Type: | Shack Hartmann, Lateral Shearing, Hartmann, Zernike, Other / Not specified |
| Repeatability: | Lambda/200 RMS |
| Phase Point Resolution: | 272 x 200 |
| Absolute Accuracy: | λ/100 RMS |
| Pupil Size: | 7.0 x 5.2 mm² |
Features
The LIFT 272 enables you to perform multiple functions by
combining :
- Ultra-high spatial resolution of 272 x 200, allowing characterization over several hundreds of Zernike polynomials
- Accuracy of λ/100 RMS permitting small defects detection
- Dynamic range superior to 1000 λ for direct wavefront acquisition of converging and diverging beams
Applications
Successfully used in the most demanding of applications in optical metrology, microscopy, and laser diagnostics, The LIFT 272 enables you to :
- Quantify the optical system’s aberrations
- Align the system to ensure that it performs at its best
- Predict the optical system’s performance in terms of focalization capability or imaging quality
- Quantify the effects of temperature and gravity on the system’s performance
- Verify that the optics comply with specifications
- Directly measure the optical system’s wavelength dependency
- Pilot a wavefront corrector to change the system’s aberrations
- Check whether the optical mount overly distorts the optics
Frequently Asked Questions
The LIFT 272 wavefront sensor has a resolution of 272 x 200 phase points.
The LIFT 272 is successfully used in optical metrology, microscopy, and laser diagnostics applications.
The LIFT 272 can quantify optical system aberrations, align the system, predict performance, quantify temperature and gravity effects, measure wavelength dependency, pilot a wavefront corrector, and check for optical mount distortion.
The LIFT 272 has a dynamic range superior to 1000 λ for direct wavefront acquisition of converging and diverging beams.
No, the LIFT 272 features SpotTracker technology that provides absolute wavefront and tilt information, eliminating alignment requirements.