Thumbnail of Phasics SID4 DWIR Dual Band Infrared Wavefront Sensor 3-5µm 8-14µm photo 1

Description

SID4 DWIR Dual-Band Infrared Wavefront Sensor for MWIR and LWIR Metrology

The SID4 DWIR is a high-resolution dual-band infrared wavefront sensor designed for precise optical metrology across both the 3–5 µm mid-wave infrared (MWIR) band and the 8–14 µm long-wave infrared (LWIR) band. Built for demanding infrared testing environments, it enables accurate phase and intensity characterization of IR optics, blackbody sources, laser beams, and complete electro-optical systems. Its dual-band capability makes it a versatile solution for laboratories and production teams that need one instrument for multiple infrared measurement tasks.

Engineered for applications in the laser industry, defense, aerospace, and infrared optical component manufacturing, the SID4 DWIR supports the characterization of complex IR assemblies where standard visible or near-infrared wavefront sensors are not suitable. It is especially relevant for evaluating 3.39 µm and 10.6 µm laser beams, thermal imaging optics, infrared windows, lens assemblies, collimators, beam expanders, and other systems operating in the MWIR and LWIR spectral regions.

With an aperture of 10.88 x 8.16 mm² and phase and intensity sampling of 160 x 120, the SID4 DWIR provides detailed spatial information for wavefront analysis while maintaining a compact footprint for integration into optical test benches. Its 68 µm phase spatial resolution helps users identify localized aberrations, alignment errors, optical surface defects, and beam quality issues that can affect system performance in infrared imaging and laser propagation applications.

The sensor delivers strong metrology performance with phase resolution of 25 nm RMS and absolute accuracy of 75 nm RMS, making it suitable for quantitative wavefront measurements in research, development, quality assurance, and production testing. A 50 fps frame rate, combined with real-time processing above 10 fps at full resolution when used with compatible software, supports dynamic alignment, live beam diagnostics, and rapid feedback during optical system optimization.

Compared with conventional infrared beam profiling or single-band wavefront measurement tools, the SID4 DWIR provides a broader measurement approach for users working across both key thermal infrared atmospheric windows. Its Giga Ethernet interface, robust form factor, and approximately 1.6 kg weight make it practical for laboratory deployment, industrial test stations, and system-level characterization setups. For organizations requiring accurate dual-band infrared wavefront sensing, the SID4 DWIR offers a specialized, off-the-shelf metrology platform for advanced MWIR and LWIR optical performance analysis.

Phasics SID4 DWIR Dual Band Infrared Wavefront Sensor 3-5µm 8-14µm

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Specifications

Wavelength Range: 3000 – 14000 nm
# Pixels (Width): 160
# Pixels (Height): 120
Lenslet Pitch: 68 um
Wavefront Accuracy: <= lambda/50
Type: Lateral Shearing
Sensor Type: Dual band wavefront sensor
Wavelength Range: 3-5 µm and 8-14 µm
Aperture Dimensions: 10.88 x 8.16 mm²
Phase Spatial Resolution: 68 µm
Phase & Intensity Sampling: 160 x 120
Resolution (Phase): 25 nm RMS
Accuracy (Absolute): 75 nm RMS
Frame Rate: 50 fps
Real-time Processing Frequency: > 10 fps (full resolution)
Interface: Giga Ethernet
Dimensions: 89 x 102 x 156 mm
Weight: ~1.6 kg

Got questions about specs? Use the inquiry form to ask.

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Features

  • Dual-Band Infrared Wavefront Sensor: The SID4 DWIR is an off-the-shelf high-resolution wavefront sensor designed for both MWIR 3–5 µm and LWIR 8–14 µm spectral bands.
  • Ideal for IR Optics and Laser Beam Characterization: Well suited for testing and alignment of infrared optics, optical assemblies, blackbody sources, 3.39 µm laser beams, 10.6 µm CO₂ laser beams, and complete IR systems.
  • High-Resolution Phase and Intensity Measurement: Provides simultaneous wavefront phase and intensity sampling with a 160 x 120 measurement grid for detailed infrared beam analysis.
  • Large Infrared Measurement Aperture: Features a 10.88 x 8.16 mm² aperture, enabling accurate characterization of mid-wave and long-wave infrared beams and optical components.
  • Fine Spatial Resolution: Delivers 68 µm phase spatial resolution, supporting precise measurement of wavefront distortions, aberrations, and beam quality.
  • Excellent Phase Resolution: Offers 25 nm RMS phase resolution, making it suitable for demanding infrared metrology, optical testing, and laser diagnostics applications.
  • High Absolute Accuracy: Provides 75 nm RMS absolute wavefront accuracy for reliable characterization of IR lenses, mirrors, windows, assemblies, and laser systems.
  • Fast Acquisition Rate: Operates at up to 50 frames per second, allowing dynamic wavefront monitoring and real-time infrared beam diagnostics.
  • Real-Time Wavefront Processing: Supports real-time processing above 10 fps at full resolution when used with PhaseStudio software.
  • Optimized for Defense, Aerospace, and Laser Industry Applications: Designed for use in defense optics, aerospace systems, laser manufacturing, thermal imaging systems, and infrared optical component qualification.
  • Gigabit Ethernet Interface: Equipped with a GigE interface for robust, high-speed data transfer and easy integration into laboratory, production, and test-bench environments.
  • Compact Industrial Design: Measures approximately 89 x 102 x 156 mm and weighs around 1.6 kg, making it practical for optical benches, R&D labs, and system integration.
  • Non-Interferometric Wavefront Measurement: Based on Phasics’ advanced wavefront sensing technology, the SID4 DWIR enables accurate IR phase measurement without the complexity of traditional interferometric setups.
  • Supports Mid-Wave and Long-Wave IR Testing: A strong solution for laboratories and manufacturers requiring one sensor for both 3–5 µm MWIR wavefront analysis and 8–14 µm LWIR wavefront analysis.
  • Production and R&D Ready: Suitable for research laboratories, industrial quality control, optical system alignment, laser beam profiling, and infrared sensor development.

Applications

Applications for the SID4 DWIR Dual-Band Infrared Wavefront Sensor

  • MWIR and LWIR wavefront sensing: High-resolution wavefront measurement in the 3–5 µm mid-wave infrared and 8–14 µm long-wave infrared spectral bands.
  • Infrared optics characterization: Testing and validation of IR lenses, mirrors, windows, domes, filters, beam expanders, and complete optical assemblies.
  • Thermal imaging system testing: Alignment, calibration, and performance verification of thermal cameras, IR imaging modules, and dual-band infrared imaging systems.
  • Defense and surveillance systems: Wavefront analysis for infrared targeting systems, night vision platforms, missile seekers, IR trackers, and surveillance payloads.
  • Aerospace infrared payloads: Qualification and optical performance testing of spaceborne and airborne MWIR/LWIR sensors, telescopes, and remote sensing instruments.
  • CO₂ laser beam characterization: Measurement of wavefront quality, beam shape, and alignment of 10.6 µm CO₂ laser sources and laser-based systems.
  • 3.39 µm laser beam analysis: Characterization of infrared laser beams operating near 3.39 µm, including laser collimation and optical quality assessment.
  • Blackbody source characterization: Evaluation of IR blackbody emitters, thermal sources, and calibration references used in infrared metrology and camera calibration.
  • Infrared lens production quality control: Fast inspection of transmitted wavefront error, optical aberrations, and assembly defects during IR lens manufacturing.
  • Optical component alignment: Real-time alignment of infrared optical systems, including multi-element lens assemblies and beam delivery optics.
  • Adaptive optics for infrared systems: Wavefront measurement for closed-loop correction, deformable mirror testing, and IR adaptive optics development.
  • IR optical coating validation: Performance testing of coatings and substrates designed for MWIR and LWIR transmission or reflection.
  • Freeform and aspheric IR optics testing: Metrology support for advanced infrared optical components used in compact, high-performance imaging systems.
  • Beam profiling and laser diagnostics: Simultaneous phase and intensity analysis for infrared laser beams used in industrial, scientific, and defense applications.
  • High-energy laser system diagnostics: Wavefront monitoring for IR laser propagation, beam quality optimization, and optical train verification.
  • Environmental and atmospheric IR research: Characterization of infrared optical systems used in gas sensing, remote detection, atmospheric measurements, and spectroscopy.
  • Hyperspectral and multispectral IR instrumentation: Testing of optical subsystems for MWIR/LWIR spectrometers, multispectral imagers, and infrared sensor platforms.
  • Cryogenic infrared optics evaluation: Measurement of optical performance changes in IR components and assemblies operating under cooled or cryogenic conditions.
  • Research and development laboratories: Advanced infrared wavefront metrology for universities, national labs, laser labs, aerospace R&D, and optical engineering teams.
  • Production testing of dual-band IR systems: Repeatable, high-speed quality assurance for systems that operate across both 3–5 µm and 8–14 µm infrared bands.

Frequently Asked Questions

What is the SID4 DWIR dual-band infrared wavefront sensor used for?
The SID4 DWIR is an off-the-shelf high-resolution infrared wavefront sensor designed for the 3–5 µm MWIR band and the 8–14 µm LWIR band. It is used to characterize IR optics, optical assemblies, blackbody sources, 3.39 µm laser beams, 10.6 µm CO2 laser beams, and infrared systems for laser industry, defense, aerospace, and optical component testing applications.
What wavelength ranges does the SID4 DWIR wavefront sensor cover?
The SID4 DWIR covers two important infrared spectral bands: 3–5 µm and 8–14 µm. This makes it suitable for dual-band IR wavefront measurements in both mid-wave infrared and long-wave infrared applications.
Can the SID4 DWIR measure CO2 laser beams at 10.6 µm?
Yes. The SID4 DWIR is specifically suited for characterizing 10.6 µm laser beams, including CO2 lasers, because 10.6 µm falls within its 8–14 µm long-wave infrared operating range.
Is the SID4 DWIR suitable for measuring 3.39 µm infrared laser beams?
Yes. The SID4 DWIR can characterize 3.39 µm laser beams because this wavelength is within its 3–5 µm mid-wave infrared operating band.
What are the spatial resolution and sampling specifications of the SID4 DWIR?
The SID4 DWIR provides a phase spatial resolution of 68 µm with phase and intensity sampling of 160 x 120 points. Its aperture dimensions are 10.88 x 8.16 mm², allowing high-resolution wavefront and intensity characterization across infrared beams and optical systems.
What phase accuracy and resolution does the SID4 DWIR provide?
The SID4 DWIR offers a phase resolution of 25 nm RMS and an absolute accuracy of 75 nm RMS. These specifications make it suitable for precise infrared wavefront analysis of IR optics, lasers, and thermal imaging system components.
What frame rate and interface does the SID4 DWIR use?
The SID4 DWIR operates at up to 50 fps and supports real-time processing at more than 10 fps at full resolution when used with PhaseStudio software. It connects through a Gigabit Ethernet interface, making it practical for laboratory, production, and system-integration environments.

Got more questions? Use the inquiry form to ask the supplier directly.

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