LIFT LP Large Pupil Wavefront Sensor

Visit the Imagine Optic Store

Specifications

Wavelength Range: 400 – 800 nm
# Pixels (Width): Not Specified
# Pixels (Height): Not Specified
Lenslet Pitch: Not Specified
Wavefront Accuracy: Other
Type: Shack Hartmann, Hartmann, Zernike, Other / Not specified
Aperture Dimension: 22 x 22 mm²
Phase Point Resolution: 512 x 512
Maximum Acquisition Frequency: 10 Hz
VIS Calibrated Wavelength: 400 - 800 nm
Minimum Power: 0.7 nW
Repeatability: < λ/200 RMS
Absolute Wavefront Measurement Accuracy: λ/100 or 6 nm RMS
Spatial Sampling: ~ 170 µm
Dimension (Height X Width X Length): 100.7 x 104.5 x 121 mm3
Document icon Download Data Sheet Download icon

Features


  • 22 mm large analysis pupil for direct wavefront characterization without relay optics or beam conditioning

  • Accuracy of λ/100 RMS permitting small defects detection

  • Dynamic range superior to 1000 λ for direct wavefront acquisition of converging and diverging beams

Applications

The LIFT LP is the perfect tool for direct characterization of relatively large optical beams without the need for relay optics to adapt the beam to the metrology tool. It is easier, faster to implement and more accurate: no more added optics means no more added aberrations and no need for specific setup calibration. 



  • Laser beam testing, accurate laser collimation

  • Laser optical alignment and optimization to allow optimal M2- parameter values

  • Characterization of optics, lens, protective windows, mirror with transmitted wavefront error (TWE) and surface shape in reflection (SFE) using the same wavefront sensor and over a large spectral bandwidth

  • Production QC, specifications check of purchased optics prior to integration

  • Alignment of optical systems, based on live aberration information