LIFT SWIR 160 Wavefront Sensor

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Specifications

Wavelength Range: 980 – 1650 nm
# Pixels (Width): Not Specified
# Pixels (Height): Not Specified
Lenslet Pitch: Not Specified
Wavefront Accuracy: Other
Type: Shack Hartmann, Hartmann, Zernike, Other / Not specified
Repeatability:: < lambda/200 RMS
Phase Point Resolution:: 640 x 512
Pupil Size:: 9,30 x 7,44 mm²
Absolute Accuracy: λ/100 RMS
Phase Sampling: 160 x 128
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Features

Successfully used in the most demanding applications in optical metrology, laser diagnostics and adaptive optics, the LIFT SWIR 160 performs multiple functions:



  • Direct wavefront acquisition of highly converging and diverging beams with an accuracy of λ/100 rms, including astigmatism and high-order aberration, and many other parameters, making for the perfect instrument for any complex optics alignment.

  • Beam collimation with sensitivity > 1 km radius of curvature

  • Control and adjustment of axial laser beam deviation > 3μrad rms

  • Complex optics characterization in single or double path configuration in combination with R-FLEX2 metrology systems or RFLEX LA metrology platforms.

  • 3D MTF measurements

  • Simultaneous and independent measurements of phase and intensity (patented)

Applications


  • Optical manufacturing metrology

  • Complex optics Characterization

  • Middle frequencies mirror surface characterization

  • Optical quality control, metrology (LIDAR, free space communication, Automotive, Space and defense)

  • Prediction of an optical system performance in terms of focalization capability or imaging quality

  • Pilot a wavefront corrector to control system’s aberrations

  • Quantification of the effects of temperature and gravity on the performance of an optical system