LIFT 680 Wavefront sensor

Specifications

Wavelength Range: 400 – 750 nm
# Pixels (Width): Not Specified
# Pixels (Height): Not Specified
Lenslet Pitch: Not Specified
Wavefront Accuracy: Other
Type: Shack Hartmann, Hartmann, Zernike, Other / Not specified
Repeatability: Lambda/200 RMS
Phase Point Resolution: 680 x 504
Pupil Size: 13.78 x 10.21 mm²
Wavelength: 400-750 nm
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Features

LIFT 680 enables you to perform multiple functions by combining :



  • Ultra-high spatial resolution of 680 x 504, allowing characterization over several hundreds of Zernike polynomials

  • Accuracy of λ/100 RMS permitting small defects detection

  • Dynamic range superior to 1000 λ for direct wavefront acquisition of converging and diverging beams

Applications

Successfully used in the most demanding applications in optical metrology, microscopy, and laser diagnostics, the LIFT 680 performs multiple functions:



  • Characterize complex optics, including meta-surface and freeform optics

  • Quantify laser impact (LIDT)

  • Perform surface characterization on high and middle frequencies mirrors

  • Predict the performance of optical systems in terms of focusing capability or imaging quality 

  • Quantify the effects of temperature and gravity on system performance

  • Drive a wavefront corrector to correct for system aberrations