M15 EEL 661 nm Laser Module – 50-80 mW Visible Red Diode with APC & Adjustable Focus

Visit the LECC Technology Co., Ltd. Store

Specifications

Center Wavelength: 0.661 um
Output Power: 50 mW
CW Optical Power: 50-80 mW
Operating Current: 45-100 mA
Operating Voltage: 12 V
Wavelength At Peak Emission: 661 nm
Operating Temp. Range: -10 to 70 °C
Storage Temp. Range: -40 to 85 °C
Line Size At 100mm (beam Profile Test FWHM 50%): 40 um
Line Size At 400mm (beam Profile Test FWHM 50%): 120 um
Driving Circuit: APC
Document icon Download Data Sheet Download icon

Features


  • Center Wavelength: 661 nm (visible red)

  • Output Power Range: 50–80 mW (typical)

  • Built-in APC (Automatic Power Control) circuitry — ensures stable optical output over time & temperature

  • Adjustable focus assembly — enables tuning of divergence/spot size for precise delivery

  • Supports CW & PW modes — excellent for continuous alignment and pulsed scanning/inspection

  • Compatible with optional optical lenses (DOE, Powell) for custom beam patterns: lines, crosses, arrays, graphics

  • Rugged module housing for industrial usage; optimized for measurement, alignment and instrumentation environments

  • Ideal for visible-red applications requiring high output and pattern versatility

Applications

Industrial Inspection & Metrology



  • Precision alignment and targeting in machine vision systems

  • Automated Optical Inspection (AOI) for electronics, PCB, micro-assembly

  • Edge/feature detection in manufacturing lines using red-light source


Optical Alignment & Calibration



  • Visible reference beams for optical bench, fiber-optic coupling or free-space setups

  • Calibration of sensors and imaging systems with stable red laser reference

  • Beam-shaping with DOE/Powell lenses for line/projector applications


Research & Prototyping



  • Laboratory instrumentation using 661 nm for fluorescence excitation, Raman scattering or optogenetics reference

  • Custom beam pattern generation for novel imaging, sensing or materials-characterization devices

  • Pulsed red diode operation in time-resolved optical systems


Display, Graphics & Projection



  • Generating visible red line or array patterns (via DOE) for motion tracking, gesture recognition or interactive systems

  • Projection of cross-lines or grid overlays in alignment or calibration tools


Educational & Demo Systems



  • Teaching modules illustrating beam shaping, laser stability and optics in academic/engineering labs

  • Demonstration of visible-red laser modules for coursework, prototyping or hands-on optics labs