Andor iKon-M PV Inspector - NIR Optimized CCD
Description
Andor’s PV Inspector NIR Camera is designed to offer ultimate speed and sensitivity performance for in-line Electro- and Photoluminescence Inspection, delivering > 90% QE beyond 800 nm and incorporating Fringe Suppression Technology™ to minimize fringing effects in the NIR. The 1024 x 1024 array boasts high resolution 13 μm pixels, and benefits from negligible darkcurrent with thermoelectric cooling down to -70°C. PV Inspector offers industry highest throughput via rapid readout speeds up to 5 MHz, combined with a unique ‘dual exposure ring mode’ that allows fast exposure switching. A lockable USB 2.0 port ensures secure vibration resistant connectivity.
The enhanced NIR sensitivity and unique high speed modes of the PV Inspector enable dual exposure EL inspection at rates in excess of 1 cell per second, ideally suited for very high throughput PV inspection systems as found in stringers and cell sorters. Rapid, dual exposure imaging, allows for quantitative measurement of cells under distinct bias levels.
Andor iKon-M PV Inspector - NIR Optimized CCD
Specifications |
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|---|---|
| Sensor Type: | CCD |
| # Pixels (Width): | 1024 |
| # Pixels (Height): | 1024 |
| Pixel Size (Square): | 13 um |
| Peak Quantum Efficiency: | 95 % |
| Full Frame Rate: | 4.4 fps |
| Bit Depth: | 16 bit |
Features
- QE > 90% beyond 800 nm
- 5 MHz and 3 MHz readout speeds
- Dual Exposure Ring Mode
- Fringe Suppression Technology ™
- UltraVac™
Applications
- In-line Electro- and Photoluminescence Inspection
- Biomedical applications
For pricing, technical or any other questions please contact the supplier
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- No markups, no fees
- Direct contact with supplier
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How to order?
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Ships from:
United Kingdom
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Sold by:
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On FindLight:
since 2015
Frequently Asked Questions
The Andor iKon-M PV Inspector is a NIR optimized CCD camera designed for in-line Electro- and Photoluminescence Inspection.
The QE of the PV Inspector is > 90% beyond 800 nm.
Fringe Suppression Technology™ is a technology incorporated in the PV Inspector that minimizes fringing effects in the NIR.
The PV Inspector offers rapid readout speeds up to 5 MHz.
The Dual Exposure Ring Mode is a unique acquisition mode in the PV Inspector that allows fast exposure switching without re-programming time overhead.