Description
The 410-DHR is a groundbreaking portable device designed for the precise verification of optical properties of large objects in the field. This innovative product is the result of a collaborative effort between the U.S. Naval Air Systems Command and Surface Optics, with significant contributions from the Naval Research Lab (NRL) and the National Institute of Standards and Technology (NIST). The 410-DHR is engineered to measure the integrated surface reflectance of surfaces at two specific angles of incidence, 20° and 60°, across six discrete wavelength bands ranging from 0.9 to 12 μm.
This portable emissometer is a versatile tool that offers in-band reflectance and emittance measurements across various spectral ranges, including 0.9-1.1, 1.9-2.4, 3.0-4.0, 3.0-5.0, 4.0-5.0, and 8.0-12.0 microns. Its design allows for the measurement of both curved and large objects without the need for special jigs or fixtures, making it highly adaptable for field use. The device's capability to provide data at two incident angles ensures comprehensive analysis and data accuracy.
The 410-DHR is equipped with a built-in touchscreen display, which facilitates easy calibration, measurement setup, and data management. This intuitive interface allows users to review and manage data efficiently, whether in the field or in a laboratory setting. The device's quick calibration process, taking only one minute at the start of a measurement session, and its rapid data collection capability, with measurements completed in 10 seconds or less, make it an indispensable tool for professionals requiring immediate and reliable data.
Designed with portability and ease of use in mind, the 410-DHR offers a robust solution for various applications, including IR signature analysis, stealth coatings, thermal modeling, thermal camera calibration, and emissivity measurements in wafer fabrication. Its compliance with ASTM standards and the use of a specular gold calibration coupon ensures high accuracy and repeatability, making it a trusted choice for critical measurements.
410-DHR Reflectometer
Specifications
| Wavelength Range (reflectance): | 900 – 12000 nm |
|---|---|
| Minimum Scan Time: | 7 sec |
| Measured Parameter: | Directional hemispherical reflectance (DHR) |
| Measured Value: | Absolute reflectance (0-1) |
| Wavelength Bands (microns): | .9-1.1, 1.9-2.4, 3.0-4.0, 3.0-5.0, 4.0-5.0, 8.0-12.0 |
| Angle Of Incidence: | 20º & 60º from normal incidence |
| ASTM Standards: | E903 |
| Calibration Coupon: | Specular Gold |
| Accuracy: | +/- .03 |
| Repeatability: | ±.005 units |
| Beam Spot Size: | 0.50 inches |
| Measurement Time: | 10 sec |
| Sample Size & Geometry: | Flat: ≥ 0.5 in. diameter, Curved: 6 in. convex; 12 in. concave |
| Warm Up Time: | 90 seconds |
| Time Between Measurements: | 2 seconds |
| Sample Temperature: | Ambient or heated/cooled to 0 - 100º C |
| Operating Temp: | 0º to 40º C |
| Run Time: | 2 hours on one battery |
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Features
- Portable Emissometer: Designed for field verification of optical properties of large objects.
- Dual Angle Measurement: Measures integrated surface reflectance at 20° and 60° angles of incidence.
- Wide Spectral Range: Covers six discrete wavelength bands from 0.9 to 12 μm.
- Immediate Data Access: Features a touchscreen display for quick data review and management.
- Fast Calibration: One-minute calibration at the start of each measurement session.
- Quick Data Collection: Obtain measurements in 10 seconds or less.
- Versatile Measurement Capability: Suitable for curved and large objects without special jigs or fixtures.
- Optional Grazing Angle Model: Available with an 80° incident angle.
- Portable Command Module Configuration: Built-in touchscreen and intuitive software for easy field or lab use.
- Desktop Remote Control Unit (RCU) Configuration: Offers flexibility in operation and control.
- Compliance: Subject to US export regulations; may require a license prior to export.
Applications
- IR Signature Analysis: Supports defense and aerospace stealth technology verification.
- Stealth Coatings & Low Observables: Critical for evaluating coating performance in field conditions.
- Thermal Modeling: Provides accurate input data for simulation and analysis.
- Thermal Camera Calibration: Ensures precision in infrared imaging systems.
- Wafer Fabrication: Determines emissivity of semiconductor wafers in production.
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