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YLF(Unioriental)
Unioriental Optics
OVERVIEW
Unioriental grows Nd, Pr, Er, Ho and no doped YLF crystals using the Czochralski technique. The use of high quality starting materials for crystal growth, whole boule interferometry and precise measurement of bulk losses using transmission spectroscopy assures that each crystal will perform to customer specifications.
SPECIFICATION
- Type Of Crystal: YLF
- Crystal Diameter: 1 mm
- Crystal Length: 1 mm
- AR Coating: One side, Both sides, Uncoated
Applications
Dopant Concentration Tolerance 0.1%
Parallelism <10 arc seconds
Perpendicularity <5 arc minutes
Chamfer 0.1mm @45°
Clear Aperture 95%
Surface Quality 10/5
Surface Flatness λ/10 @ 633nm
Wavefront Distortion <7mm diameter: λ/10@633nm, ≥7mm diameter: λ/8@633nm
Damage Threshhold 15J/CM2 TEM00, 10NS, 10HZ
Parallelism <10 arc seconds
Perpendicularity <5 arc minutes
Chamfer 0.1mm @45°
Clear Aperture 95%
Surface Quality 10/5
Surface Flatness λ/10 @ 633nm
Wavefront Distortion <7mm diameter: λ/10@633nm, ≥7mm diameter: λ/8@633nm
Damage Threshhold 15J/CM2 TEM00, 10NS, 10HZ
KEY FEATURES
1. Dopant concentrations between 0.5 and 3.0mol%;
2. Rod sizes from 1mm to 25.4mm in diameter and from 1mm to 180mm in length;
3. Large rod and slab dimensions and non-standard dopant concentrations are
available upon request;
4. AR, HR and HT coating are available upon request;
5. Orientation of rod axis to crystal a-axis or c-axis within 2 degrees.
2. Rod sizes from 1mm to 25.4mm in diameter and from 1mm to 180mm in length;
3. Large rod and slab dimensions and non-standard dopant concentrations are
available upon request;
4. AR, HR and HT coating are available upon request;
5. Orientation of rod axis to crystal a-axis or c-axis within 2 degrees.
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