Multiple Order Quarter Waveplate 514 nm
Description
Ealing Multiple Order Waveplates are available in a range of laser-line wavelenths, mounted in a 25.4 mm diameter mount. Multiple Order Waveplates are sensitive to changes in temperature, angle of incidence, and degree of collimation. They are intended for use at the design wavelength only. If used at a different wavelength, a retardation change of 10% occurs for every 0.2 nm deviation.
Multiple Order Quarter Waveplate 514 nm
Specifications |
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|---|---|
| Waveplate Type: | Multiple Order |
| Material: | Quartz |
| Mounting: | Mounted |
| Shape: | Round |
| Size: | 25.4 mm |
| Center Wavelength: | 514 nm |
| Retardation: | Lambda/4 |
| Retardation Accuracy: | +/- Lambda/200 |
| Wavefront Distortion: | <= Lambda/8 |
| Surface Quality (Scratch-Dig): | 10-5 |
Features
Quarter and half waveplates
Zero or multiple order available
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How to order?
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Ships from:
United States
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Sold by:
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On FindLight:
since 2017
Frequently Asked Questions
A Multiple Order Quarter Waveplate is a waveplate that is sensitive to changes in temperature, angle of incidence, and degree of collimation. It is intended for use at the design wavelength only.
The features of the Multiple Order Quarter Waveplate include quarter and half waveplates, zero or multiple order available.
The applications of Half Waveplates include rotating the plane of polarization (e.g. in a laser), electro-optic modulation, and as a variable ratio beamsplitter (when used in conjunction with a polarizing cube).
The fast and slow axis of a waveplate are indicated by the marked lines on the mount. The extraordinary beam has a higher refractive index and therefore a slower velocity, while the ordinary beam has a lower refractive index and therefore a faster velocity.
The formula for calculating the phase difference of a waveplate is θ = ± 2vd (ne-no) λ where θ is the phase difference, d is the thickness of the waveplate in mm, ne and no are the refractive indices of the extraordinary and ordinary rays respectively, and λ is the wavelength in nm.