Quantas-Q-SPARK-532: High Energy Compact Nanosecond DPSS Laser

Description

The Quantas-Q-SPARK-532 series is an air-cooled, diode-pumped, Q-switched laser designed for researchers and application specialists. Operating at a wavelength of 532 nm, it delivers pulse energies ranging from 0.5 mJ to 10 mJ, with a repetition rate of up to 100 Hz. With features like remote monitoring, control, and support, along with active or passive Q-switching, this laser provides versatility and reliability for various applications.

Specifications

Avg. Power:	0.125 W
Wavelength:	532 nm
Repetition Rate:	0.01 – 0.1 kHz
Pulse Duration:	0.8 ns
Pulse-to-Pulse Stability (RMS):	1.5 %
Cooling:	Air
Pulse Energy:	0.5 to 10 mJ
Typical Pulse Duration:	<2.0 ns
Linewidth:	SLM
Power Drift:	± 3.0 %
Beam Divergence:	<1.5 mrad
Polarization:	linear, horizontal
Jitter (RMS):	1 µs
Transmission Range:	0.5-95 %
Laser Head (W×L×H):	140 × 277 × 135 mm³
Controller Unit (W×L×H):	108 × 191 × 59 mm³
Power Adapter (W×L×H) Typical (for +12 VDC Output):	50 × 125 × 32 mm³
Ambient Temperature::	15-30 °C
Relative Humidity (non-condensing):	10-80 %
Mains Voltage:	90 – 230 VAC, single phase, 47 – 63 Hz
Q-Switch Type:	passive, Cr:YAG/active, Pockels cell

Got questions about specs? Use the inquiry form to ask.

Download Data Sheet

Features

Wavelength: 532 nm
Pulse Energy: 0.5 mJ to 5 mJ
Repetition Rate: Up to 100 Hz
Shot Lifetime of Pump Diodes: >2 G shots
Remote Monitoring, Control, and Support
Built-in Sync Pulse Generator
Air-cooled
Active or Passive Q-Switching

Applications

Applications for Air-Cooled Short Pulse Q-Switched Laser

Laser-Induced Breakdown Spectroscopy (LIBS): High-peak-power nanosecond and sub-nanosecond pulses for elemental analysis of metals, minerals, glass, ceramics, polymers, soils, coatings, and environmental samples.
Light Detection and Ranging (LiDAR): Compact air-cooled pulsed laser source for range finding, atmospheric sensing, remote mapping, target illumination, and time-of-flight distance measurements.
Laser Ablation: Efficient pulsed ablation of metals, semiconductors, ceramics, thin films, and composite materials using high pulse energy at 1064 nm and optional harmonic wavelengths.
Precision Micromachining: Short-pulse processing for micro-drilling, micro-structuring, trimming, patterning, scribing, and surface texturing with reduced thermal effects.
Time-of-Flight Spectroscopy (TOFS): Sub-nanosecond to nanosecond optical pulses for precise timing experiments, ion generation, and time-resolved measurement systems.
Time-Resolved Spectroscopy (TRS): Pump source for studying fast photophysical, photochemical, and material dynamics in research laboratories and analytical instruments.
Raman Spectroscopy: Pulsed excitation source for Raman analysis, time-gated Raman spectroscopy, and fluorescence-suppressed spectral measurements.
Nonlinear Optics Research: High peak power pulses for harmonic generation, frequency conversion, nonlinear crystal testing, optical limiting, and laser-matter interaction studies.
OPO and Dye Laser Pumping: Compact pulsed pump laser for optical parametric oscillators, tunable laser sources, and dye laser systems requiring high-energy Q-switched pulses.
Pump-Probe Experiments: Synchronized short-pulse excitation for ultrafast and fast dynamics studies in materials science, chemistry, biology, and semiconductor research.
Time-Domain Thermoreflectance (TDTR): Pulsed laser source for thermal conductivity measurements, thin-film thermal characterization, and heat transport studies.
Photoacoustic Imaging and Spectroscopy: Nanosecond laser excitation for photoacoustic signal generation in biomedical imaging, materials inspection, and chemical sensing.
Plasma Generation: High-intensity pulsed laser source for laser-induced plasma experiments, plasma diagnostics, breakdown studies, and emission spectroscopy.
Mass Spectrometry Ionization: Pulsed UV or IR laser source for laser desorption, ionization studies, MALDI research, and time-of-flight mass spectrometry development.
Semiconductor Inspection and Failure Analysis: Short-pulse laser source for defect analysis, circuit edit support, thin-film removal, wafer inspection, and localized material modification.
Thin Film Processing: Laser patterning, removal, annealing, and modification of coatings, transparent conductive oxides, semiconductor layers, and functional films.
Surface Cleaning and Coating Removal: Pulsed laser cleaning of contaminants, oxides, residues, paint, and coatings from sensitive or high-value surfaces.
Laser Marking and Engraving: High-contrast marking, micro-engraving, serialization, and traceability coding on metals, ceramics, polymers, and electronic components.
Materials Research: Controlled high-energy pulse delivery for studying ablation thresholds, damage thresholds, photothermal effects, and laser-material interaction mechanisms.
Optical Breakdown and Damage Testing: Testing of optics, coatings, fibers, crystals, and photonic components under high peak power nanosecond pulse exposure.
Fluorescence Lifetime and Photoluminescence Studies: Pulsed excitation for lifetime measurements, gated detection, phosphor characterization, and luminescent material analysis.
Combustion and Flow Diagnostics: Laser-based diagnostics for combustion research, gas-phase spectroscopy, particle analysis, and high-speed flow visualization.
Particle Image Velocimetry (PIV) and Flow Visualization: Pulsed illumination source for synchronized imaging of particles, aerosols, sprays, and fluid motion.
Remote Sensing and Atmospheric Measurements: Pulsed laser transmitter for aerosol detection, cloud profiling, gas sensing, and environmental monitoring applications.
Security and Defense Research: Eye-safe system development, target designation research, range-gated imaging, standoff detection, and high-peak-power pulsed illumination