Custom Optical Monocrystalline Infrared CaF2 Calcium Fluoride Round Step Window

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Specifications

Substrate Material: IR Grade CaF2
Antireflection Coating: Uncoated
Diameter: 20 mm
Surface Quality: 60-40 scratch-dig
Surface Flatness: lambda/4
Thickness: 2 mm
Dimension Tolerance: +0/-0.1mm
Parallelism: <3 arcmin
Bevel: <0.35mm
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Features

  • Broadband Infrared Transmittance: Exhibits excellent transmittance in the wavelength range of 0.13–12 μm, with extremely low absorption loss for infrared light, suitable for various mid-to-far infrared optical systems.
  • Precision Stepped Structure: Equipped with multiple test surfaces of known thicknesses, with strictly controlled thickness tolerance, ensuring high accuracy in optical calibration and measurement scenarios.
  • Superior Material Properties: Made of high-purity polycrystalline CaF₂, featuring low refractive index dispersion, good thermal stability, and resistance to laser damage, adaptable to harsh working environments such as high-power laser systems.
  • Versatile Structural Design: The step window structure combines the functions of a standard window (light transmission) and a step component (thickness reference), realizing multi-scene application integration.
  • Excellent Optical Uniformity: The polycrystalline structure is uniformly distributed, ensuring consistent optical performance across the entire effective area, avoiding interference with light transmission and detection results.

Applications

  • Infrared Spectrometer Calibration: Used for wavelength calibration and precision verification of infrared spectrophotometers and Fourier Transform Infrared (FTIR) spectrometers, ensuring the accuracy of detection data.
  • Laser Energy Attenuation Control: Serves as a stepped attenuator in mid-infrared laser systems, achieving controllable laser energy attenuation through different thickness steps to meet the power requirements of laser processing, laser ranging and other scenarios.
  • Optical Film Thickness Testing: Acts as a substrate carrier in optical coating processes; after film deposition, the film thickness change at the step is measured to verify the uniformity and precision of the coating process.
  • Infrared Imaging System Calibration: Used for resolution and sensitivity calibration of infrared thermal imagers, night vision devices, etc., simulating target contours to optimize imaging algorithms and lens design.
  • Scientific Research and Precision Optical Experiments: Serves as a standard reference part in optical material research and light transmission characteristic experiments, providing comparative data for the development of new infrared optical materials.