Frequently Asked Questions

The Rincon Cross-Correlator Pulse Profiling System is specifically developed for measuring a wide array of output parameters from ultrafast laser systems including contrast ratio of laser pulses, determining pulse pedestal, pre- and post-pulses, and amplified spontaneous emission in femtosecond systems.

A portion of the input pulse is converted to the second harmonic (SH) with a nonlinear crystal. A dichroic mirror reflects the SH and transmits the fundamental thus splitting the beam into the two arms of the cross-correlator. The fundamental beam arm includes a retro reflector and delay-line. After passing through the delay-line the fundamental is recombined with the SH and focused into a DKDP or BBO crystal (depending on the input pulse wavelength). Mixing the fundamental and SH pulses in the nonlinear crystal produces non-collinear third harmonic generation (TH). By filtering out the fundamental and SH frequencies, the TH can be isolated. Measuring the TH signal as a function of the optical delay between the fundamental and SH pulses gives the third order cross correlation function.

The Rincon Cross-Correlator Pulse Profiling System provides information about the third-order cross-correlation function of pulse intensity on a femtosecond scale and can be used for alignment of high power femtosecond lasers.

The Rincon Cross-Correlator Pulse Profiling System has high temporal resolution over a long (close to 1 ns) window, which shows pulse features that are usually missed, giving the user a detailed and complete picture of the quality and stability of the output pulse parameters of their femtosecond laser system.

Yes, the Rincon Cross-Correlator Pulse Profiling System is easy to operate and includes a full set of user-friendly software tools for data collection and analysis. The system also includes opto-mechanical assembly and electronics connected with USB interface for a PC.

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