X-Ray and EUV Cameras (Detection Method: Indirect Detection)

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X-ray Time Delay Integration CCD Camera XTI12848-004

X-ray Time Delay Integration CCD Camera XTI12848-004

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Sold by: X-Scan Imaging Corp Ships from: United States
Specifications
Sensor Type: CCD
Detection Method: Indirect Detection
# Pixels (Width): 2048
# Pixels (Height): 128
Pixel Size (Square): 48 um
Photonic Science X-ray sCMOS 37.7MP 1:1 Detector

Photonic Science X-ray sCMOS 37.7MP 1:1 Detector

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Sold by: Photonic Science and Engineering Ships from: United Kingdom
Specifications
Energy Range: 1keV-55keV with Gadox:Tb/20keV-300keV with CsI
Detector Interface: 10 Gigabit Ethernet / Genicam compliant
Spatial Resolution (µm): <30µm FWHM with GdOS:Tb & <70µm FWHM with CsI:Tl
Exposure: 80 microseconds up to 600 seconds
Peak QE: 72% at scintillator emission wavelength (without microlens)
X-Ray and EUV Cameras utilizing indirect detection are essential for applications requiring high-resolution imaging and precise material analysis. These cameras, featuring CMOS and CCD sensor types, offer a diverse range of capabilities suitable for various high-energy environments. Suppliers like X-Scan Imaging Corp and Photonic Science and Engineering provide robust solutions tailored to specific imaging needs. On FindLight, you can compare technical specifications, request detailed pricing, and directly connect with manufacturers without the need for registration.