X-ray Time Delay Integration CCD Camera XTI12848-004
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Ships from:
United States
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On FindLight:
since 2020
Description
Time Delay Integration (TDI) is a special image acquisition method that is used for in-line inspection application that requires highspeed, high sensitivity and high resolution. XTI12848 TDI camera is designed for long life with a Fiber Optic Plate that separates the sensor from the X-Ray path. X-Scan Imaging can help users select the scintillator for specific applications. Pixels are 48 µm × 48 µm. Binning modes 2×2, 4×4, 8×8, etc. allow for imaging at higher speed with lower resolutions.
X-ray Time Delay Integration CCD Camera XTI12848-004
Specifications |
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|---|---|
| Sensor Type: | CCD |
| Detection Method: | Indirect Detection |
| # Pixels (Width): | 2048 |
| # Pixels (Height): | 128 |
| Pixel Size (Square): | 48 um |
| Bit Depth: | 16 bit |
| Full Frame Rate: | Not Specified |
| X-Ray Energy Range: | 40000 – 15000000 eV |
Features
- High speed, resolution & sensitivity
- Imaging with off-axis, fiber-optic design
- User-select X-ray scintillating material GOS, CsI(Tl),CdWO4, etc.
- A selection of lengths: 4inches (2048 pixels), 9 inches (4608 pixels), 12 inches (6144 pixels)
- Highly extended lifetimes
- Camera Link (Base configuration) and GigE
- Vision interfaces
- 16-bit digitization and data output
- 100-240-V, 50-60-Hz power
- Software development kit (SDK) with application programming interface (API)
Applications
- PCB/SMT inspection
- In-line Non-Destructive Testing (NDT)
- High-energy x-ray, gamma-ray, betatron and neutron im
Frequently Asked Questions
The applications of the XTI12848 TDI camera include PCB/SMT inspection, In-line Non-Destructive Testing (NDT), and High-energy x-ray, gamma-ray, betatron and neutron imaging.
The available binning modes for the XTI12848 TDI camera are 2×2, 4×4, 8×8, etc. which allow for imaging at higher speed with lower resolutions.
The pixel size of the XTI12848 TDI camera is 48 µm × 48 µm.
The XTI12848 TDI camera is designed for long life with a Fiber Optic Plate that separates the sensor from the X-Ray path.
Time Delay Integration (TDI) is a special image acquisition method that is used for in-line inspection application that requires high-speed, high sensitivity and high resolution.