Photonic Science X-ray Laue Back-Scattered Camera

Name: Photonic Science X-ray Laue Back-Scattered Camera
Brand: Photonic Science and Engineering
Availability: InStock

Description

The high resolution Laue X-ray camera allows a digital Laue diffraction pattern to be recorded with a resolution of 2774 x 1843 pixels and 14-bit digitization.

The X-ray passes through the camera and is collimated down < 1mm diameter. The active area input dimension is similar to that of Polaroid film i.e. 156 mm x 104.4 mm. Exposures from a few seconds up to >30 minutes can be adjusted during manual or automatic crystal orientations before being cut.

Twinned structures occurring during crystal growth can be unveiled using a high resolution mode. Upgrades from existing X-ray sources are made using high precision mechanics allowing accuracy down to 0.05 degrees. A micro-diffraction set-up for both laboratory and or synchrotron sources can be provided on demand.

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Specifications

Sensor Type:	CCD
Detection Method:	Indirect Detection
# Pixels (Width):	2774
# Pixels (Height):	1843
Pixel Size (Square):	64 um
Bit Depth:	18 bit
Full Frame Rate:	7.5 fps
X-Ray Energy Range:	1000 – 5500 eV

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Features

Active input area of approx. 155(h) x 105(v) 155(h) x 105(v) mm imaged on the sensor
Minimum input sizes 57μ square, 2,774 x 1,843 pixels
Selectable exposure from 1ms to 35 minutes
On chip pixel addition allowing increased sensitivity at the expense of resolution
18-bit high precision acquisition mode
14-bit fast preview mode
Automatic background subtraction mode
PSEL acquisition Laue image processing software

Applications

Realtime crystal orientation down to 0.1 degrees accuracy
Misalignment measurements down to 0.5 degrees using PSEL software
Two dimensional orientation mapping of polycrystalline silicon wafers
High throughput sapphire sample screening. Heavy duty sample screening up tp 20kg