Photonic Science X-ray sCMOS 37.7MP 1:1 Detector

Specifications

Sensor Type: CMOS
Detection Method: Indirect Detection
# Pixels (Width): 6144
# Pixels (Height): 6144
Pixel Size (Square): 10 um
Bit Depth: 16 bit
Full Frame Rate: 11 fps
X-Ray Energy Range: 1000 – 5500 eV
Energy Range: 1keV-55keV with Gadox:Tb/20keV-300keV with CsI
Detector Interface: 10 Gigabit Ethernet / Genicam compliant
Spatial Resolution (µm): <30µm FWHM with GdOS:Tb & <70µm FWHM with CsI:Tl
Exposure: 80 microseconds up to 600 seconds
Peak QE: 72% at scintillator emission wavelength (without microlens)
Sensor Temperature (ºC): Operating at -40°C with water cooling
Dark Current: <0.1 electron/pixel/second
Quantum Gain: 21 electron/8keV X-ray photon
Read Out Noise: <4 electrons in binning 1x1
Full Well Capacity: >120,000 electrons in binning 1x1
Dynamic Range: 30,000:1 in binning 1x1
Input: 10µm
Input Size: 87mm diameter (61.44mm x 61.44mm)
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Features

  • Input sizes: single 61.4 x 61.4mm straight rad hard fiber optic plate imaged on to a square large area sCMOS sensor
  • Fast readout
  • Scintillator: Gadox:Tb for operation from 1-55 keV, structured CsI scintillator from 20-300 keV
  • Simultaneous integration (readout enabling): 100% duty cycle acquisition
  • Ultra-low noise
  • Very low dark current

Applications

This X-ray sCMOS detector is ideal for the following applications:
  • Ultra Small Angle X-ray Scattering
  • Single Crystal Diffraction
  • Phase contrast imaging
  • X-ray Microscopy
  • High resolution MicroCT
  • X-ray Coherent Diffraction Imaging