NINOX SWIR 640: High-Resolution Cooled VIS-SWIR Camera for Imaging

Specifications

Camera Type: Scientific
Array Type: InGaAs
Spectral Band: 0.4 – 1.7 um
# Pixels (Height): 512
# Pixels (Width): 640
Pixel Pitch: 15 um
Array Cooling: Cooled
Cooling: Δ-35 °C
Noise (RMS): <195 (LG), <50 (HG) e-
Frame Rate: 120 Hz
Exposure Time: 1μs to 107sec or 1/frame rate
Document icon Download Data Sheet Download icon

Features


  • Best Performing SWIR Camera: The NINOX SWIR 640 is acclaimed as the best performing SWIR camera in the world, offering unparalleled imaging capabilities.

  • Cooled VIS-SWIR Technology: The camera is cooled to -20°C, enabling low dark current and longer exposure times for superior image quality.

  • High Resolution Pixel Pitch: Features a 15µm x 15µm pixel pitch for the highest resolution VIS-SWIR images.

  • High Gain Detection Limit: Achieves less than 50 electrons in high gain, allowing for the highest VIS-SWIR detection limit.

  • Ultra High Intrascene Dynamic Range: Offers a dynamic range of 70dB, enabling simultaneous capture of bright and dark portions of a scene.

  • On-board Intelligent 3 Point NUC: Ensures the highest quality images with advanced noise correction capabilities.

  • Resolution and Frame Rate: Provides a resolution of 640 x 512 and a frame rate of up to 120Hz for smooth and detailed imaging.

  • CameraLink Digital Output: Utilizes a 14-bit CameraLink base configuration for reliable data transfer.

  • Wavelength Range: Covers the VIS-SWIR range with a spectral response from 0.4mm to 1.7mm.

  • Low Dark Current: Achieves dark current levels of less than 1,500 electrons per pixel per second at -20°C.

  • Sample Applications: Ideal for a variety of applications including astronomy, beam profiling, hyperspectral imaging, semiconductor inspection, solar cell inspection, thermography, microscopy, and art inspection.

  • Optional Accessories: Includes options like filters, EPIX(R) base CL cards, and optical SWIR lenses to enhance functionality.

Applications


  • Astronomy: High sensitivity imaging for celestial observations.

  • Hyperspectral Imaging: Precise spectral capture for materials and life sciences.

  • Semiconductor & Solar Inspection: Non-destructive defect and structure analysis.

  • Beam Profiling: Accurate laser beam characterization and alignment.

  • Thermography: Advanced thermal imaging in VIS-SWIR ranges.

  • Microscopy: Enhances biological and material imaging under SWIR illumination.

  • Art Inspection: Reveals underdrawings, pigments, and restoration needs in artworks.