Neo Series High-End Spectroradiometer 250–1100 nm

Specifications

Wavelength Range (reflectance): 250 – 1100 nm
Resolution: 2.3 nm
Minimum Scan Time: 4.8 sec
Non-linearity: < 1%
Data Output Resolution: Can be set by software to virtually any resolution
Focal Length: 115 mm
NA Optical Bench: 0.10
Order Sorting Filter: Linear variable filter
Wavelength Accuracy: +/- 0.3nm
Detector Type: Hamamatsu cooled detector (S7031)
Dark Noise (RMS): ~ 3 to 5 counts (16 bit ADC)
Signal-to-Noise: >1300:1
Document icon Download Data Sheet Download icon

Features


  • High-End Spectroradiometer: The NEO series is designed for precise spectroradiometric measurements, ensuring high accuracy and reliability.

  • Speed & Ease of Use: Engineered for fast data acquisition and user-friendly operation, making it accessible for both experts and beginners.

  • Custom or OEM Options: Offers customizable configurations to meet specific requirements, including OEM solutions for seamless integration.

  • Neo Passive Accessories: A range of passive accessories, such as the SMA coupler, to enhance the functionality of the spectroradiometer.

  • Neo Active Accessories: Includes active accessories for advanced applications and improved measurement capabilities.

  • Comprehensive Specifications: Detailed specifications available, covering system response, detector type, slit size, gratings, and dispersion range.

  • System Configuration Options: Multiple configurations available, including 200 grooves/mm and 300 grooves/mm system responses for tailored performance.

  • System Performance: Optimized for low dark current and high sensitivity, ensuring reliable results in various conditions.

Applications


  • Optical Component Testing: Ideal for spectral analysis and calibration of optical devices.

  • Display Measurement and Calibration: Ensures accurate colorimetric and radiometric evaluation.

  • Light Source Characterization: Suitable for testing LEDs, lamps, and laser diodes.

  • Environmental and Material Analysis: Effective in labs for absorbance, transmittance, and reflectance measurements.

  • Production Line Integration: Seamless integration for real-time quality control and monitoring.

  • OEM and Custom Systems: Configurable for specific research or industrial applications requiring tailored spectral performance.