Introducing the CR80AH-1550-200M, a cutting-edge solution for high-speed, ultra-low light detection in various applications such as laser range finding, LIDAR, and free space communication. This advanced device combines a 500μm InGaAs Avalanche Photodiode (APD) with a hybrid preamplifier to deliver exceptional performance and reliability.

The CR80AH-1550-200M features a built-in 80μm InGaAs APD+TIA (Transimpedance Amplifier) that enhances sensitivity and ensures accurate detection even in extremely low light conditions. With a high sensitivity rating of ≥100kV/W, this photodiode enables reliable detection of weak optical signals, making it ideal for applications where precise measurements are crucial.

Designed for high-speed data acquisition, the CR80AH-1550-200M offers an impressive bandwidth of 200MHz. This feature allows for rapid signal processing and real-time response, making it suitable for demanding tasks that require fast and accurate data analysis.

Covering a wide wavelength range of 900 to 1700nm, this device provides flexibility in applications that require detection across different optical frequencies. Whether you're working with near-infrared or short-wavelength infrared light, the CR80AH-1550-200M ensures reliable performance across the specified range.

Engineered with low noise characteristics and high reliability, this photodiode ensures accurate and consistent measurements, even in challenging environments. The device's noise reduction capabilities enhance signal quality, while its robust construction guarantees long-lasting performance in demanding applications.

The CR80AH-1550-200M is packaged in a TO8 (Transistor Outline 8) package with a flat window, providing convenient and reliable integration into various systems. The TO8 package design ensures easy installation and protection of the sensitive components, allowing for seamless integration into your existing setup.