Page 4 - Optical Metrology | Non-Contact Inspection Solutions

M3 Measurement Solutions

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The M-Wave 339 Infrared Interferometer is a state of the art LUPI (Laser Unequal Path Interferometer) operating at 3.39 micrometers. It is the ideal instrument for testing mid-wave infrared imaging components/systems and optical material homogeneity.

Specifications
Interferometer Configuration:	Not Specified
Light Source:	Not Specified
Output Polarization:	Linear
RMS Repeatability:	<0.001 waves
RMS Precision:	<0.01 waves

Data Sheet

ST400 OPTICAL PROFILER

NANOVEA

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The advanced software makes it easy to select zones on screen to be scanned automatically. QC options are available to automate all aspects of testing, including pattern recognition, database communication, macro programs and analysis recipes. Larger X-Y stages, 360° rotational stages and many custom configurations ...

Specifications
Light Source Type:	Coherent Continuous Wave (CW)
Light Source Wavelength:	-- nm
Sample Reflectivity:	0-0%
Vertical Range:	-- nm
RMS Repeatability:
...

Data Sheet

PS50 COMPACT OPTICAL PROFILER

NANOVEA

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NANOVEA Optical Profiler is the ideal choice for upgrade and replacing traditional stylus and laser profilometers. All testing capabilities. In a uniquely compact set-up. At an affordable price.

Specifications
Chromatic Sensor Type:	Area Sensor
X Scan Area:	50 mm
Y Scan Area:	50 mm
Height Range:	1-1um
Scan Speed:	20 mm/sec

Data Sheet

JR25 PORTABLE OPTICAL PROFILER

NANOVEA

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Jr25 opens the door to research and quality control testing in complex environments that were out of reach to previous generations of instruments. With a fully rotational scanning head, compact design, and complete portability, no surface is out of reach.

Specifications
Chromatic Sensor Type:	Area Sensor
X Scan Area:	25 mm
Y Scan Area:	25 mm
Height Range:	1-1um
Scan Speed:	20 mm/sec

Data Sheet

OWI 150 XT invers Interferometer For Spheres and Aspheres

OptoTech Optical Machinery Inc

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High precision Fizeau workshop interferometer OWI 150 XT invers for testing of spherical and aspherical surfaces. High precision kinematics and a working range up to Ø 150 mm make this measuring machine an indispensable tool for the production of high-end optics.

Specifications
Interferometer Configuration:	Not Specified
Light Source:	Not Specified
Output Polarization:	Not Specified
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

AZP 200 HP Autocollimation Testing And Blocking Unit

OptoTech Optical Machinery Inc

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The AZP 200 HP is an optimal multi functional cementing unit for many areas of optical production. Due to various mountings and options, the AZP 200 HP can be perfectly adapted to all special cementing and centering tasks.

Specifications
Interferometer Configuration:	Not Specified
Light Source:	Not Specified
Output Polarization:	Not Specified
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

Interferometer For Spherical Optics OWI Desktop 60 mm

OptoTech Optical Machinery Inc

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The compact workshop interferometer OWI Desktop 60 mm is the ideal measuring machine for endoscopy and micro production.

Specifications
Interferometer Configuration:	Not Specified
Light Source:	Not Specified
Output Polarization:	Not Specified
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

PS Standard

Phototherm Dr Petry GmbH

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LAYER THICKNESS MEASUREMENT OF ADHESIVES AND PAINTS. CONTACTLESS AND NON-DESTRUCTIVE. HIGHEST PRECISION FOR TEST IN PRODUCTION.

Specifications
Diameter Range:	0.005-0.1mm
Resolution:	-- um
Accuracy:	0.05 um
Repeatability:	-- um

Data Sheet

PS Vision

Phototherm Dr Petry GmbH

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ACTIVE THERMOGRAPHY. VISUALIZATION OF THE LAYER THICKNESS DISTRIBUTION. DRY & WET PAINT. INSPECTION OF PVC SEAMS AND BONDING.

Specifications
Diameter Range:	0.01-0.15mm
Resolution:	-- um
Accuracy:	-- um
Repeatability:	-- um

Data Sheet

PS Light Lab

Phototherm Dr Petry GmbH

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LAYER THICKNESS MEASUREMENT FROM KTL. CONTACTLESS. SIMPLE SOLUTION FOR A QUICK MEASUREMENT.

Specifications
Diameter Range:	0.01-0.06mm
Resolution:	-- um
Accuracy:	1 um
Repeatability:	-- um

Data Sheet

TMS-150 TopMap Metro.Lab White-Light Interferomter

Polytec GmbH

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The TMS-150 TopMap Metro.Lab from Polytec is a precision white-light interferometer with a large vertical measurement range, large field of view and nanometer resolution. The compact 3D workstation easily measures without contact flatness, step height and parallelism of large surfaces and structures on even soft and delicate materials

Specifications
Light Source Type:	Pulsed LED
Light Source Wavelength:	525 nm
Sample Reflectivity:	1-1%
Vertical Range:	70000000 nm
RMS Repeatability:	<0.001 nm
...

Data Sheet

TMS-500 TopMap Pro.Surf Surface Characterization System for Precision Parts

Polytec GmbH

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The TMS-500 TopMap Pro.Surf and TMS-500-R TopMap Pro.Surf+ are high-precision, non-contact measurement systems with a large field of view for fast and efficient surface characterization of precision parts. Incorporating a traceably calibrated white-light interferometer with large vertical measurement range, TopMap Pro.Surf and ...

Specifications
Light Source Type:	CW LED
Light Source Wavelength:	525 nm
Sample Reflectivity:	1-1%
Vertical Range:	70000000 nm
RMS Repeatability:	<0.01 nm
...

Data Sheet

TMS-350L TopMap In.Line Fast Surface Characterization Setup

Polytec GmbH

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The compact design of the TMS-350 TopMap In.Line enables an elegant and easy integration into the production line. The system measures the form deviation, such as flatness or waviness, without contact, reliably and within short cycle times. Since no objectives are needed, collisions and damage to the optics or sample are avoided. The ...

Specifications
Light Source Type:	Pulsed LED
Light Source Wavelength:	525 nm
Sample Reflectivity:	1-1%
Vertical Range:	500000 nm
RMS Repeatability:	<0.001 nm
...

Data Sheet

OMS LaserScan LS01 Scanning Laser Doppler Vibrometer

Optical Measurement Systems Corp

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The OMS LaserScan LS01 Scanning Laser Doppler Vibrometer is a compact, portable, competitively priced, and easy-to-use precision instrument for whole field non-destructive testing and non-contact vibration measurement of any surface. The LaserScan LS01 uses the patented LaserPoint engine together with computer controlled scanning ...

Specifications
Velocity Range:	0.005-800mm/sec
Vibration Frequency Range:	0.1-20000Hz
Working Distance:	0.5-5m
Beam Size:	-- mm
Scan Range:	20-20deg

Data Sheet

OMS LaserPoint LP01-HF Laser Doppler Vibrometer

Optical Measurement Systems Corp

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The OMS LaserPoint LP01-HF (High Frequency) is an upgrade to the LP01 laser Doppler vibrometer that expands the vibration frequency range up to 100 kHz. The LP01-HF provides the same easy-to-use operation as well as the same compact system footprint. The system can be instantly used by aiming the laser beam at a target at any ...

Specifications
Velocity Range:	0.005-800mm/sec
Vibration Frequency Range:	0.01-100000Hz
Working Distance:	0.01-5m
Beam Size:	-- mm
Scan Range:	1-1deg

Data Sheet

OMS LaserPoint LP01 Laser Doppler Vibrometer

Optical Measurement Systems Corp

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The OMS LaserPoint LP01 Laser Doppler Vibrometer is an easy-to-use precision instrument for non-contact vibration measurement of any surface. The system can be instantly used by aiming the laser beam at a target at any distance up to five meters, without the need for any optical or mechanical adjustments. The system output is an ...

Specifications
Velocity Range:	0.005-800mm/sec
Vibration Frequency Range:	0.01-20000Hz
Working Distance:	0.01-5m
Beam Size:	-- mm
Scan Range:	1-1deg

Data Sheet

1813A Digital Linear Gauge Sensor

Ono Sokki Technology Inc

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lntroducing compact and lightweight digital linear gauge sensors that are easily installed in current production equipment. With a dust-proof and splash-proof structure that conforms to protection class IP64, the gauges can withstand harsh environments. Suitable for use in dusty environments and areas subject to drips and spIashes. ...

Specifications
Measurement Range:	13-13mm
Measurement Resolution:	1um %

Data Sheet

1730A Digital Linear Gauge Sensor

Ono Sokki Technology Inc

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lntroducing compact and lightweight digital linear gauge sensors that are easily installed in current production equipment. With a dust-proof and splash-proof structure that conforms to protection class IP64, the gauges can withstand harsh environments. Suitable for use in dusty environments and areas subject to drips and spIashes. ...

Specifications
Measurement Range:	30-30mm
Measurement Resolution:	10um %

Data Sheet

GS-1713A Digital Linear Gauge Sensor

Ono Sokki Technology Inc

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lntroducing compact and lightweight digital linear gauge sensors that are easily installed in current production equipment. With a dust-proof and splash-proof structure that conforms to protection class IP64, the gauges can withstand harsh environments. Suitable for use in dusty environments and areas subject to drips and spIashes. ...

Specifications
Measurement Range:	13-13mm
Measurement Resolution:	10um %

Data Sheet

Interferometer SP 5000 TR

PE Schall GmbH & Co KG

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Many applications in industry and research require high-precision simultaneous displacement and angle measurements. Fast set-up and easy adjustment are particularly important.Triple-beam laser interferometers are precision length measuring devices that combine three interferometers in one device. The same highly stable laser ...

Specifications
Interferometer Configuration:	Not Specified
Light Source:	Not Specified
Output Polarization:	Linear
RMS Repeatability:	Not Specified
RMS Precision:	Not Specified

Data Sheet

DIAS-1600 Digital Image Analysis System

Strainoptics Inc

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The DIAS-1600 Digital Image Analysis System, or Stress Analyzer, uses digital imaging technology for stress inspection applications. This PC-based system is used for quality control, process control, failure analysis, product development and research to ensure that residual stresses remain within specified limits. This package is ...

Specifications
Wavelength Coverage:	400-700nm
Sampling Rate:	-- Samples/Sec
Measured Parameters:	Other

Data Sheet

PS-100 Polarimeter

Strainoptics Inc

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PS-100-SF Standard Field Polarimeter – General-purpose desktop system, with a 200 x 200 mm viewing area. Includes a circular/plane polarized illuminator and analyzer. Precision measurement of retardation, birefringence, orientation, stress or strain can be achieved in accordance with widely accepted test methods. PS-100-MW ...

Specifications
Wavelength Coverage:	400-700nm
Sampling Rate:	-- Samples/Sec
Measured Parameters:	Stokes Parameters, Power, Other

Data Sheet

GASP Grazing Angle Surface Polarimeter

Strainoptics Inc

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Strainoptics’ GASP® Polarimeter is a portable instrument for measuring surface stress in soda-lime tempered glass or heat-strengthened glass. It can also be used to confirm stress-relief in annealed glass and to validate furnace settings for manufacturers of safety glass. Our most current model is the LCD-GASP (shown at left), which ...

Specifications
Wavelength Coverage:	400-700nm
Sampling Rate:	-- Samples/Sec
Measured Parameters:	Stokes Parameters, Degree of Polarization

Data Sheet

CVS trevista CAM

STEMMER IMAGING

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Trevista CAM closes the gap between simple applications for intelligent cameras and demanding surface inspection tasks. It is based on the patented trevista illumination in combination with a powerful smart camera, pre-loaded witheither Teledyne DALSA\'s Inspect or Sherlock machine vision software. The CVS trevista CAM is ideal ...

Specifications
Light Source Type:	CW LED
Light Source Wavelength:	-- nm
Sample Reflectivity:	1-1%
Vertical Range:	-- nm
RMS Repeatability:	<0.001 nm
...

Data Sheet

CVS trevista FLAT

STEMMER IMAGING

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The powerful CVS trevista FLAT takes the trevista dome geometry and reduces it to a flat and compact format. Theillumination controller is integrated into the unit, which makes integration into the inspection system easy andmakes price-sensitive applications possible. Thanks to the flat design, not only the surfaces of ...

Specifications
Light Source Type:	CW LED
Light Source Wavelength:	-- nm
Sample Reflectivity:	1-1%
Vertical Range:	-- nm
RMS Repeatability:	<0.001 nm
...

Data Sheet

Optical Metrology

Page 4 - Optical Metrology Equipment

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