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ContourX-500 3D Optical Profilometer
Bruker Nano Surfaces
The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and provides all of the industry-recognized advantages of Bruker’s white light interferometry (WLI) floor-standing ...
  • Light Source Type: CW LED, Modulated LED
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 0.05 - 100 %
  • Vertical Range: 10000000 nm
  • RMS Repeatability: <0.01 nm
  • ...
Data Sheet
ContourX-200 3D Optical Profilometer
Bruker Nano Surfaces
The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a ...
  • Light Source Type: CW LED, Modulated LED
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 0.05 - 100 %
  • Vertical Range: 10000000 nm
  • RMS Repeatability: <0.01 nm
  • ...
Data Sheet
ContourX-100 3D Optical Profilometer
Bruker Nano Surfaces
The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light ...
  • Light Source Type: CW LED, Modulated LED
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 0.05 - 100 %
  • Vertical Range: 10000000 nm
  • RMS Repeatability: <0.01 nm
  • ...
Data Sheet
ST400 OPTICAL PROFILER
NANOVEA
The advanced software makes it easy to select zones on screen to be scanned automatically. QC options are available to automate all aspects of testing, including pattern recognition, database communication, macro programs and analysis recipes. Larger X-Y stages, 360° rotational stages and many custom configurations ...
  • Light Source Type: Coherent Continuous Wave (CW)
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 0 - 0 %
  • Vertical Range: -- nm
  • RMS Repeatability:
  • ...
Data Sheet
TMS-150 TopMap Metro.Lab White-Light Interferomter
Polytec GmbH
The TMS-150 TopMap Metro.Lab from Polytec is a precision white-light interferometer with a large vertical measurement range, large field of view and nanometer resolution. The compact 3D workstation easily measures without contact flatness, step height and parallelism of large surfaces and structures on even soft and delicate materials
  • Light Source Type: Pulsed LED
  • Light Source Wavelength: 525 nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: 70000000 nm
  • RMS Repeatability: <0.001 nm
  • ...
Data Sheet
TMS-500 TopMap Pro.Surf Surface Characterization System for Precision Parts
Polytec GmbH
The TMS-500 TopMap Pro.Surf and TMS-500-R TopMap Pro.Surf+ are high-precision, non-contact measurement systems with a large field of view for fast and efficient surface characterization of precision parts. Incorporating a traceably calibrated white-light interferometer with large vertical measurement range, TopMap Pro.Surf and ...
  • Light Source Type: CW LED
  • Light Source Wavelength: 525 nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: 70000000 nm
  • RMS Repeatability: <0.01 nm
  • ...
Data Sheet
TMS-350L TopMap In.Line Fast Surface Characterization Setup
Polytec GmbH
The compact design of the TMS-350 TopMap In.Line enables an elegant and easy integration into the production line. The system measures the form deviation, such as flatness or waviness, without contact, reliably and within short cycle times. Since no objectives are needed, collisions and damage to the optics or sample are avoided. The ...
  • Light Source Type: Pulsed LED
  • Light Source Wavelength: 525 nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: 500000 nm
  • RMS Repeatability: <0.001 nm
  • ...
Data Sheet
CVS trevista CAM
STEMMER IMAGING
Trevista CAM closes the gap between simple applications for intelligent cameras and demanding surface inspection tasks. It is based on the patented trevista illumination in combination with a powerful smart camera, pre-loaded witheither Teledyne DALSA\'s Inspect or Sherlock machine vision software. The CVS trevista CAM is ideal ...
  • Light Source Type: CW LED
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: -- nm
  • RMS Repeatability: <0.001 nm
  • ...
Data Sheet
CVS trevista FLAT
STEMMER IMAGING
The powerful CVS trevista FLAT takes the trevista dome geometry and reduces it to a flat and compact format. Theillumination controller is integrated into the unit, which makes integration into the inspection system easy andmakes price-sensitive applications possible. Thanks to the flat design, not only the surfaces of ...
  • Light Source Type: CW LED
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: -- nm
  • RMS Repeatability: <0.001 nm
  • ...
Data Sheet
Form Talysurf Intra Touch
Spectrum Metrology Ltd
The new Intra Touch from Taylor Hobson - the latest in their range of shopfloor measurement solutions for surface finish, form and optional contour analysis - incorporates the user-friendly Talyprofile software on a touchscreen tablet PC.  
  • Light Source Type: CW LED
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: -- nm
  • RMS Repeatability: <0.01 nm
  • ...
Data Sheet
Surtronic-R Precision High Speed Roundness Measurement
Spectrum Metrology Ltd
The new Surtronic-R Series is a high speed roundness measurement station which is robust enough for shopfloor but accurate enough for any inspection room.The Surtronic R-80 is ideal for a range of roundness measurement applications including aerospace and automotive engineering: Valves ... Con Rods ... Pins ... Brake Discs .. ...
  • Light Source Type: CW LED
  • Light Source Wavelength: 30 nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: 6 nm
  • RMS Repeatability: <0.01 nm
  • ...
Data Sheet
Form Talysurf Intra Contour
Spectrum Metrology Ltd
This latest portable shop floor contour system in the Form Talysurf range offers a wide range of 32mm to accommodate even the largest features on typical components with enough resolution to detect the smallest contour deviations (120nm) (super precision mode delivers 25nm over a 6.4mm range).  A 20mm range pickup option offers ...
  • Light Source Type: CW LED
  • Light Source Wavelength: 120 nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: -- nm
  • RMS Repeatability: <0.01 nm
  • ...
Data Sheet
Form Talysurf PGI Optics
Taylor Hobson Precision
Taylor Hobson Form Talysurf PGI (Phase Grating Interferometer) - contact stylus profilometer/Equipment measures large sag lens (surfaces form) plastic lenses, small components, IR glass and crystals up to 300mm diameter with high accuracy and it is a number one instrument for optics manufacturers. Following its first release in 1984, ...
  • Light Source Type: Coherent Continuous Wave (CW)
  • Light Source Wavelength: 2 nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: -- nm
  • RMS Repeatability: <0.001 nm
  • ...
Data Sheet
Form Talysurf PGI Matrix
Taylor Hobson Precision
aylor Hobson Stylus Optics Profilometer: Form Talysurf PGI Matrix is an easy to set-up, test and analysis for single or multiple parts. This instrument is perfect optical surface form measurement system for fast and accurate testing of optical components up to 200 mm Diameter. A modular system, adaptable for differing budgets and ...
  • Light Source Type: Coherent Continuous Wave (CW)
  • Light Source Wavelength: -- nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: -- nm
  • RMS Repeatability: <0.001 nm
  • ...
Data Sheet
Form Talysurf PGI Freeform
Taylor Hobson Precision
aylor Hobson\'s Form Talysurf PGI (Phase Grating Interferometer) is a versatile, high resolution 3D  Freeform profilometer for high precision freeform optics measurement. It performs surface finish and form analysis for freefrom optics. Taylor Hobson’s Form Talysurf® PG Freeform is underpinned by ...
  • Light Source Type: Coherent Continuous Wave (CW)
  • Light Source Wavelength: 800 nm
  • Sample Reflectivity: 1 - 1 %
  • Vertical Range: -- nm
  • RMS Repeatability: <0.001 nm
  • ...
Data Sheet
The NanoCam Sq dynamic optical profiler measures surface roughness on supersmooth optics and precision surfaces. The non-contact NanoCam Sq is a vast improvement over the messy replication methods required with traditional workstation optical profilers and provides excellent portability for measuring large optics. By enabling ...
  • Light Source Type: Pulsed LED
  • Light Source Wavelength: 460 nm
  • Sample Reflectivity: 1 - 100 %
  • Vertical Range: 115 nm
  • RMS Repeatability: <0.005 nm
  • ...
Data Sheet

Did You know?

The smoothness or roughness of a surface greatly impacts the quality of performance on that surface. It can determine how quickly a liquid flows through a pipe, how easily paint will stick to a wall, and the ability of a bowling ball to roll down a lane. An optical surface profiler is a measuring instrument developed to analyze a surface's profile in order to quantify its roughness. This involves categorizing irregularities using height, depth and interval measurements. Surface profilers can measure many types of surfaces, from very smooth to super rough, with precision smaller than 0.1 nm!