Form Talysurf PGI Freeform

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 800 nm
Sample Reflectivity: 1 – 1 %
RMS Repeatability: <0.001 nm
RMS Precision: <0.001 nm
Magnification: Other / Not specified
Application: 3D Imaging
Software Compatibility: Other / Not specified
Z-axis Sensing Technology: Not Specified
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Features


  • Ultra-Precision Measurement: The LuphoScan system offers non-contact 3D form measurement of aspheric surfaces using advanced MWLI® technology, suitable for steep, small, and large aspheres.

  • Wide Measurement Range: Capable of handling optics with diameters up to 420 mm, making it ideal for a variety of optical components.

  • Comprehensive 3D Analysis: Provides full 3D form measurement for aspheres, spheres, flats, and slight freeforms, ensuring detailed analysis and precision.

  • Automated Aspheric Optics Measurement: The Form Talysurf® PGI Dimension offers fully automated, one-touch measurement for both 2D and 3D analysis of spheres, aspherics, and diffractives up to 300 mm in diameter.

  • Time-Saving Software: Advanced software features, such as the Aspherics Analysis Utility (AAU), enhance production efficiency and improve error detection.

  • Versatile Measurement Capabilities: Suitable for virtually any part, including steep, shallow, large, and small components, ensuring flexibility in various applications.

  • Innovative Developments: Recent advancements include the Form Talysurf® PGI Freeform and LuphoSharp, reflecting Taylor Hobson's commitment to pioneering metrology solutions.

Applications


  • Freeform Optics Manufacturing: Ensures accurate measurement of complex optical geometries.

  • Asphere and Sphere Production: Provides high-precision analysis for quality control.

  • Diffractive and Hybrid Optics: Validates advanced optical components with precision.

  • Optical R&D: Supports development of innovative freeform designs using modern equations.

  • Metrology Laboratories: Provides a complete solution for both standard and custom optical surface validation.