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Optical Surface Profilers (RMS Repeatability: <0.001 nm)

Taylor Hobson Form Talysurf PGI (Phase Grating Interferometer) - contact stylus profilometer/Equipment measures large sag lens (surfaces form) plastic lenses, small components, IR glass and crystals up to 300mm diameter with high accuracy and it is a number one instrument for optics manufacturers. Following its first release in 1984, ...

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 2 nm
Sample Reflectivity: 1 – 1 %
Vertical Range: Not Specified
RMS Repeatability: <0.001 nm
aylor Hobson Stylus Optics Profilometer: Form Talysurf PGI Matrix is an easy to set-up, test and analysis for single or multiple parts. This instrument is perfect optical surface form measurement system for fast and accurate testing of optical components up to 200 mm Diameter. A modular system, adaptable for differing budgets and ...

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: Not Specified
Sample Reflectivity: 1 – 1 %
Vertical Range: Not Specified
RMS Repeatability: <0.001 nm
aylor Hobson\'s Form Talysurf PGI (Phase Grating Interferometer) is a versatile, high resolution 3D  Freeform profilometer for high precision freeform optics measurement. It performs surface finish and form analysis for freefrom optics. Taylor Hobson’s Form Talysurf® PG Freeform is underpinned by ...

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 800 nm
Sample Reflectivity: 1 – 1 %
Vertical Range: Not Specified
RMS Repeatability: <0.001 nm
On FindLight marketplace you will find 3 different Optical Surface Profilers (RMS Repeatability: <0.001 nm) from top global suppliers. Compare features, request pricing, and connect instantly with manufacturers — no registration required.