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Optical Surface Profilers (Application: 3D Imaging)

3D Mapping Technology
Optics for Hire
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3D Mapping Technology
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Optics for Hire (OFH) introduces a groundbreaking approach to 3D depth mapping, leveraging our extensive expertise in distance measurement and imaging technologies. Our innovative method, detailed in US Application No. 14/256,085, utilizes a pattern projector combined with an astigmatic lens to create precise depth maps. This ...

Specifications
Measurement Technique: Other (not specified)
Light Source Type: Modulated Laser
Light Source Wavelength: 650 nm
Sample Reflectivity: 10 – 90 %
Vertical Range: 10 nm
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Form Talysurf PGI Optics
Taylor Hobson
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Form Talysurf PGI Optics
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The Taylor Hobson Form Talysurf® PGI Optics is the industry-standard solution for the precise measurement of aspheric and diffractive optics. Since its introduction in 1984, it has become the benchmark system for global optics manufacturers, delivering unmatched form accuracy, repeatability, and measurement reliability. Powered by ...

Specifications
Measurement Technique: Other (not specified)
Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 2 nm
Sample Reflectivity: 1 – 1 %
RMS Repeatability: <0.001 nm
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Form Talysurf PGI Matrix
Taylor Hobson
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Form Talysurf PGI Matrix
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The Taylor Hobson Form Talysurf® PGI Matrix is a fully automated, high-speed, and highly accurate system designed for precision measurement of optical components. Ideal for both single-part and batch testing, it streamlines the measurement process with easy set-up, automated alignment, and instant analysis. Combining the renowned ...

Specifications
Measurement Technique: Other (not specified)
Light Source Type: Coherent Continuous Wave (CW)
Sample Reflectivity: 1 – 1 %
RMS Repeatability: <0.001 nm
RMS Precision: <0.001 nm
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Form Talysurf PGI Freeform
Taylor Hobson
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Form Talysurf PGI Freeform
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The Taylor Hobson Form Talysurf® PG Freeform is a versatile, high-resolution metrology system specifically designed for the accurate measurement and analysis of complex freeform optics. Leveraging decades of Taylor Hobson’s expertise in ultra-precision manufacturing and measurement, the system provides unrivalled accuracy, ...

Specifications
Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 800 nm
Sample Reflectivity: 1 – 1 %
RMS Repeatability: <0.001 nm
RMS Precision: <0.001 nm
Data Sheet
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On FindLight marketplace you will find 4 different Optical Surface Profilers (Application: 3D Imaging) from top global suppliers. Compare features, request pricing, and connect instantly with manufacturers — no registration required.