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Optical Surface Profilers (RMS Repeatability: <0.01 nm)

3D Mapping Technology
Optics for Hire
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3D Mapping Technology
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Optics for Hire (OFH) introduces a groundbreaking approach to 3D depth mapping, leveraging our extensive expertise in distance measurement and imaging technologies. Our innovative method, detailed in US Application No. 14/256,085, utilizes a pattern projector combined with an astigmatic lens to create precise depth maps. This ...

Specifications
Measurement Technique: Other (not specified)
Light Source Type: Modulated Laser
Light Source Wavelength: 650 nm
Sample Reflectivity: 10 – 90 %
Vertical Range: 10 nm
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On FindLight marketplace you will find 1 different Optical Surface Profilers (RMS Repeatability: <0.01 nm) from top global suppliers. Compare features, request pricing, and connect instantly with manufacturers — no registration required.