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Stokes Microspot Ellipsometer LSE-MS
Gaertner Scientific Corp
Has a 15 micron measuring laser beam diameter, manual  XY micrometer positioning stage and camera for viewing the measurement area  on your PC. Areas as small as 15 X 45 micron can be measured. The units\' simple yet robust design offers ease of use and instantaneous measurement and  is a welcome alternative to overly ...
  • Spectral Range: 670 - 670 nm
  • Spectral Resolution: -- nm
  • Angle Of Incidence: 70 - 70 deg
Data Sheet
Multiwavelength Laser Ellipsometers LSE-WS
Gaertner Scientific Corp
Multiwavelength Laser Ellipsometers give the user greater versatility in thickness and refractive index measurement of thin transparent and semi-transparent films. Laser light sources have ample light intensity for increased measurement accuracy of absorbing and rough scattering films. Laser sources have the added advantage of being ...
  • Spectral Range: 405 - 830 nm
  • Spectral Resolution: -- nm
  • Angle Of Incidence: 1 - 1 deg
Data Sheet
Stokes Laser Ellipsometer LSE-USB
Gaertner Scientific Corp
The model LSE-USB with convenient USB interface uses advanced StokesMeterâ„¢ technology (previous winner of  Photonics Spectra and R&D 100 best new products awards). The unit\'s simple robust design offers unprecedented ease of use and instantaneous measurement. It is a popular alternative to overly complicated ellipsometers ...
  • Spectral Range: 670 - 670 nm
  • Spectral Resolution: -- nm
  • Angle Of Incidence: 70 - 70 deg
Data Sheet
Referenced Spectroscopic Ellipsometer Nanofilm-rse
Halcyonics GmbH
The nanofilm_RSE is a special type of ellipsometer, which compares the sample to a reference. In this way, the ellipsometric difference between sample and reference can be measured. Due to the orientation of the reference, none of the optical components need to be moved or modulated during measurement, and the full high resolution ...
  • Spectral Range: 450 - 900 nm
  • Spectral Resolution: 1000 nm
  • Angle Of Incidence: 1 - 1 deg
Data Sheet
Imaging Ellipsometer Nanofilm-ep4
Halcyonics GmbH
The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as small as 1 micron. This enables resolving sample areas 1000 times smaller than most non-imaging ellipsometers, even if they use ...
  • Spectral Range: 250 - 1700 nm
  • Spectral Resolution: 300 nm
  • Angle Of Incidence: 1 - 1 deg
Data Sheet
Brewster Angle Microscope Nanofim-ep4-bam
Halcyonics GmbH
The nanofilm_ep4bam is a special configuration of the ep4 imaging ellipsometry platform. It is an ideal thin films imaging system and can be upgraded to an imaging ellipsometer. It is a completely \"hands-off\" computer-controlled system, using proprietary motor control circuitry. The nanofilm_ep4bam displays real-time images of your ...
  • Spectral Range: 250 - 1700 nm
  • Spectral Resolution: 1000 nm
  • Angle Of Incidence: 1 - 1 deg
Data Sheet
ISE ELLIPSOMETER
JA Woollam Co Inc
The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing.  Using our proven technology, the iSE enables users to optimize optical properties of deposited films, control film growth with sub-angstrom sensitivity, and monitor growth kinetics. The iSE utilizes a new optical ...
  • Spectral Range: 400 - 1000 nm
  • Spectral Resolution: 190 nm
  • Angle Of Incidence: 60 - 75 deg
Data Sheet
RC2U ELLIPSOMETER
JA Woollam Co Inc
The RC2® design builds on 25 years of experience. It combines the best features of previous models with innovative new technology: dual rotating compensators, achromatic compensator design, advanced light source and next-generation spectrometer design. The RC2 is a near-universal solution for the diverse applications of ...
  • Spectral Range: 210 - 1000 nm
  • Spectral Resolution: 790 nm
  • Angle Of Incidence: 45 - 90 deg
Data Sheet
M-2000V ELLIPSOMETER
JA Woollam Co Inc
The M-2000® line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool. The M-2000 delivers both speed and ...
  • Spectral Range: 370 - 1000 nm
  • Spectral Resolution: 390 nm
  • Angle Of Incidence: 45 - 90 deg
Data Sheet