Has a 15 micron measuring laser beam diameter, manual  XY micrometer positioning stage and camera for viewing the measurement area  on your PC. Areas as small as 15 X 45 micron can be measured. The units\' simple yet robust design offers ease of use and instantaneous measurement and  is a welcome alternative to overly ...

Multiwavelength Laser Ellipsometers give the user greater versatility in thickness and refractive index measurement of thin transparent and semi-transparent films. Laser light sources have ample light intensity for increased measurement accuracy of absorbing and rough scattering films. Laser sources have the added advantage of being ...

The model LSE-USB with convenient USB interface uses advanced StokesMeter™ technology (previous winner of  Photonics Spectra and R&D 100 best new products awards). The unit\'s simple robust design offers unprecedented ease of use and instantaneous measurement. It is a popular alternative to overly complicated ellipsometers ...

The nanofilm_RSE is a special type of ellipsometer, which compares the sample to a reference. In this way, the ellipsometric difference between sample and reference can be measured. Due to the orientation of the reference, none of the optical components need to be moved or modulated during measurement, and the full high resolution ...

The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as small as 1 micron. This enables resolving sample areas 1000 times smaller than most non-imaging ellipsometers, even if they use ...

The nanofilm_ep4bam is a special configuration of the ep4 imaging ellipsometry platform. It is an ideal thin films imaging system and can be upgraded to an imaging ellipsometer. It is a completely \"hands-off\" computer-controlled system, using proprietary motor control circuitry. The nanofilm_ep4bam displays real-time images of your ...

The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing.  Using our proven technology, the iSE enables users to optimize optical properties of deposited films, control film growth with sub-angstrom sensitivity, and monitor growth kinetics. The iSE utilizes a new optical ...

The RC2® design builds on 25 years of experience. It combines the best features of previous models with innovative new technology: dual rotating compensators, achromatic compensator design, advanced light source and next-generation spectrometer design. The RC2 is a near-universal solution for the diverse applications of ...

The M-2000® line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool. The M-2000 delivers both speed and ...