Optical Metrology
- Chromatic Sensors
- Displacement Gages
- Ellipsometers
- Interferometers
- Laser Vibrometers
- Optical Frequency Combs
- Optical Surface Profilers
- Polarimeters
- Refractometers
- Strain Gages
- Thickness Measuring Systems
- Wavelength Meters
- Metrology Accessories
- Laser Micrometers
- Shearography Systems
- Scatterometers
- Video Micrometers
FILTER PRODUCTS
Ellipsometers
Frequently Asked Questions
An ellipsometer is an optical metrology tool used to measure the thickness and refractive index of thin films. It is commonly used in industries such as semiconductor manufacturing and materials research.
An ellipsometer works by measuring changes in the polarization of light that is reflected off a surface. The ratio of the reflected light's amplitude and phase is measured to determine the thickness and refractive index of the film being measured.
Ellipsometers offer high accuracy and precision, making them ideal for use in industries where thin film characterization is critical. They are also non-destructive, which means they can be used to measure delicate or fragile films without damaging them. Additionally, they are able to measure the thickness and refractive index of films simultaneously.
Ellipsometers are used in a variety of industries, including semiconductor manufacturing, optics, and materials research. They are commonly used for thin film analysis, including the measurement of film thickness, refractive index, and surface roughness.
When choosing an ellipsometer, it is important to consider factors such as accuracy, measurement range, and compatibility with the materials being measured. It is also important to choose an ellipsometer with the appropriate wavelength range and polarization control for the application. Additionally, the sample stage must be compatible with the sample being measured.
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