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Page 3 - Optical Metrology Equipment

Stokes Microspot Ellipsometer LSE-MS
Gaertner Scientific Corp
Has a 15 micron measuring laser beam diameter, manual  XY micrometer positioning stage and camera for viewing the measurement area  on your PC. Areas as small as 15 X 45 micron can be measured. The units\' simple yet robust design offers ease of use and instantaneous measurement and  is a welcome alternative to overly ...

Specifications

Spectral Range: 670-670nm
Spectral Resolution: -- nm
Angle Of Incidence: 70-70deg
Data Sheet
Multiwavelength Laser Ellipsometers LSE-WS
Gaertner Scientific Corp
Multiwavelength Laser Ellipsometers give the user greater versatility in thickness and refractive index measurement of thin transparent and semi-transparent films. Laser light sources have ample light intensity for increased measurement accuracy of absorbing and rough scattering films. Laser sources have the added advantage of being ...

Specifications

Spectral Range: 405-830nm
Spectral Resolution: -- nm
Angle Of Incidence: 1-1deg
Data Sheet
Stokes Laser Ellipsometer LSE-USB
Gaertner Scientific Corp
The model LSE-USB with convenient USB interface uses advanced StokesMeter™ technology (previous winner of  Photonics Spectra and R&D 100 best new products awards). The unit\'s simple robust design offers unprecedented ease of use and instantaneous measurement. It is a popular alternative to overly complicated ellipsometers ...

Specifications

Spectral Range: 670-670nm
Spectral Resolution: -- nm
Angle Of Incidence: 70-70deg
Data Sheet
ELWI-GER 3000 2-Dimensional Measurement System
Hofbauer Optik Mess- & Prüftechnik
The ELWIMAT-AKF VIS is an autocollimator with scale display for visual evaluation on a magnifying screen. It is used wherever visual autocollimators with eyepieces have been used so far. It offers a simple and inexpensive way to use an autocollimator in all known applications.        
Data Sheet
Referenced Spectroscopic Ellipsometer Nanofilm-rse
Halcyonics GmbH
The nanofilm_RSE is a special type of ellipsometer, which compares the sample to a reference. In this way, the ellipsometric difference between sample and reference can be measured. Due to the orientation of the reference, none of the optical components need to be moved or modulated during measurement, and the full high resolution ...

Specifications

Spectral Range: 450-900nm
Spectral Resolution: 1000 nm
Angle Of Incidence: 1-1deg
Data Sheet
Imaging Ellipsometer Nanofilm-ep4
Halcyonics GmbH
The new generation of microscopic thin film, surface and materials metrology tool uses a combination of auto nulling ellipsometry and microscopy to enable surface characterization with lateral resolution as small as 1 micron. This enables resolving sample areas 1000 times smaller than most non-imaging ellipsometers, even if they use ...

Specifications

Spectral Range: 250-1700nm
Spectral Resolution: 300 nm
Angle Of Incidence: 1-1deg
Data Sheet
Brewster Angle Microscope Nanofim-ep4-bam
Halcyonics GmbH
The nanofilm_ep4bam is a special configuration of the ep4 imaging ellipsometry platform. It is an ideal thin films imaging system and can be upgraded to an imaging ellipsometer. It is a completely \"hands-off\" computer-controlled system, using proprietary motor control circuitry. The nanofilm_ep4bam displays real-time images of your ...

Specifications

Spectral Range: 250-1700nm
Spectral Resolution: 1000 nm
Angle Of Incidence: 1-1deg
Data Sheet
Dispersive Virtual Reference Analyser
Inometrix Inc
The Dispersive Virtual ReferenceTM Analyser, based on our patented Virtual ReferenceTM Interferometer Technology, characterizes chromatic dispersion of short length optical components. This elegant new solution for the high precision characterization of optical channels works with third party tunable laser systems (Agilent/Keysight ...
Data Sheet
Virtual Reference Analyser
Inometrix Inc
The Virtual Reference™ Analyser is the next generation of chromatic dispersion measurement instruments based on our patented Virtual Reference™ Interferometer Technology. This elegant new solution for the high precision characterization of optical channels works with third party tunable laser systems (Agilent/Keysight ...
Data Sheet
StrainScope Flex Modular Real-Time Polarimeters
Ilis GmbH
The StrainScope® Flex is the ideal solution for varying measuring tasks or the realization of special solutions, e.g. in development and process automation. The design is compact and modular. All important components such as camera, lens and optical filters are directly accessible. Changing the lens or adjusting the working ...

Specifications

Wavelength Coverage: 1-1nm
Sampling Rate: -- Samples/Sec
Measured Parameters: Degree of Polarization
Data Sheet
StrainScope Imaging Real-Time Polarimeters
Ilis GmbH
With the StrainScope, mechanical stresses can be measured and visualized in real time. The StrainScope can be used flexibly wherever conventional polariscopes and polarimeters are used. The StrainScope provides objective and reproducible readings and minimizes operator influence.

Specifications

Wavelength Coverage: 1-1nm
Sampling Rate: -- Samples/Sec
Measured Parameters: Degree of Polarization
Data Sheet
ISE ELLIPSOMETER
JA Woollam Co Inc
The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing.  Using our proven technology, the iSE enables users to optimize optical properties of deposited films, control film growth with sub-angstrom sensitivity, and monitor growth kinetics. The iSE utilizes a new optical ...

Specifications

Spectral Range: 400-1000nm
Spectral Resolution: 190 nm
Angle Of Incidence: 60-75deg
Data Sheet
RC2U ELLIPSOMETER
JA Woollam Co Inc
The RC2® design builds on 25 years of experience. It combines the best features of previous models with innovative new technology: dual rotating compensators, achromatic compensator design, advanced light source and next-generation spectrometer design. The RC2 is a near-universal solution for the diverse applications of ...

Specifications

Spectral Range: 210-1000nm
Spectral Resolution: 790 nm
Angle Of Incidence: 45-90deg
Data Sheet
M-2000V ELLIPSOMETER
JA Woollam Co Inc
The M-2000® line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool. The M-2000 delivers both speed and ...

Specifications

Spectral Range: 370-1000nm
Spectral Resolution: 390 nm
Angle Of Incidence: 45-90deg
Data Sheet
Miniature Phase Shift Laser Interferometer
Kiyohara Optics USA
Miniature Phase Shift Laser Interferometer.

Specifications

Interferometer Configuration: Not Specified
Light Source: 780nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Mach-Zehnder Interferometer
Kiyohara Optics USA
Mach-Zehnder Interferometer.

Specifications

Interferometer Configuration: Not Specified
Light Source: Not Specified
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: <0.01 waves
Data Sheet
I-Test Plane Degree Test Device For Hard Disk
Kiyohara Optics USA
I-Test Plane Degree Test Device For Hard Disk.

Specifications

Interferometer Configuration: Not Specified
Light Source: Not Specified
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Data Sheet
Holography
Karl Stetson Associates LLC
This diagram illustrates the modular design of the Electronic Holography optical head mounted on an 18-inch square pallet.  It is composed of 3 modules: an interferometer module, a beamsplitter module, and an illumination module, which can be attached to the beamsplitter module to form a single unit.  The interferometer and ...

Specifications

Inspection Area: -- cm^2
Data Sheet
Speckle Correlation
Karl Stetson Associates LLC
This diagram illustrates the modular design of the Electronic Speckle Correlation optical head mounted on an 18-inch square pallet.  It is composed of 5 small modules, which manipulate the laser beam and divide it into two illumination beams that illuminate the object from two equal and opposite angles. The illumination angles ...

Specifications

Inspection Area: -- cm^2
Data Sheet
TLAser103 Single-Axis Scanning Laser Micrometers
LaserLinc Inc
Single-axis (also called single-plane) models make measurements from a single viewpoint.  The product to measure is perpendicular to the measurement field.  (See the associated image.)  Typically, the micrometer is used to measure product diameter and position.  To see illustrations and explanations of these and ...

Specifications

Number Of Axes: Single-Axis
Min Part Size: 0.015 mm
Max Part Size: 2.2 mm
Data Sheet
TLAser203 Dual-Axis Scanning Laser Micrometers
LaserLinc Inc
Dual-axis (also called dual-plane) models make measurements from two viewpoints.  The two axes of measurement are coplanar and perpendicular to each other.  The product to measure is perpendicular to the measurement field.  (See the associated image.)  Typically, the micrometer is used to measure product diameter, ...

Specifications

Number Of Axes: Dual-Axis
Min Part Size: 0.04 mm
Max Part Size: 2.0 mm
Data Sheet
EpiCurve TT Curvature Measurement System
LayTec AG
To overcome the challenges that occur with larger wafers (4\", 6\" or 8\"), you need the advanced EpiCurve® TT system. It combines wafer curvature measurements with all the features of the EpiTT:emissivity-corrected pyrometry and growth rate/thickness measurements by three-wavelength reflectance. This tool will help you avoid ...

Specifications

Index Measurement Range: 3-20
Accuracy: -1-1
Repeatability: 1-1
Data Sheet
EpiTT Product Family
LayTec AG
EpiTT combines measurements of temperature and  reflectance at three wavelengths in one tool. For True Temperature (TT), we apply the method of Emissivity Corrected Pyrometry, which delivers the precise surface temperatures of opaque materials at 950 nm (Si, GaAs, InP). For materials that are transparent at 950 nm (GaN, ...

Specifications

Index Measurement Range: 3-20
Accuracy: 1-1
Repeatability: 1-1
Data Sheet
XPLOR-100 3D Optical Inspection Station
M3 Measurement Solutions
XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.

Specifications

Index Measurement Range: 400-1000
Accuracy: -0.001-0.001
Repeatability: -0.001-0.001
Data Sheet
PRISM PRO IR REFRACTOMETER
M3 Measurement Solutions
The Prism Pro - IR is a state of the art Infrared Refractometer. It is the ideal instrument for characterizing infrared material properties of dispersion and refractive index.

Specifications

Index Measurement Range: 1000-14000
Accuracy: -0.00002-0.00002
Repeatability: -0.00005-0.00005
Data Sheet